"white-light interferometry; height profile; rough surface; speckle pattern"@en . . . "SPIE The International Society for Optical Engineering" . "1"^^ . "Pavl\u00ED\u010Dek, Pavel" . "2002-09-09+02:00"^^ . "1"^^ . . "0-8194-5146-0" . "M\u011B\u0159en\u00ED v\u00FD\u0161kov\u00E9ho profilu pomoc\u00ED interferometrie v b\u00EDl\u00E9m sv\u011Btle"@cs . "[529A2D6CECFD]" . "Height profile measurement by means of white light interferometry"@en . . . . "Proceedings SPIE - The International Society for Optical Engineering" . "M\u011B\u0159en\u00ED v\u00FD\u0161kov\u00E9ho profilu pomoc\u00ED interferometrie v b\u00EDl\u00E9m sv\u011Btle"@cs . "Height profile measurement by means of white light interferometry" . "RIV/68378271:_____/03:00100119" . . "139;144" . . . . . "White-light interferometry allows to measure the height profile of smooth as well as of rough surface. A very low measurement uncertainty is independent on the measurement range, the ambiguity problem does not occur"@en . "Washington" . . "6"^^ . . "Krzyzowa" . . . . . "White-light interferometry allows to measure the height profile of smooth as well as of rough surface. A very low measurement uncertainty is independent on the measurement range, the ambiguity problem does not occur" . "Interferometrie v b\u00EDl\u00E9m sv\u011Btle umo\u017E\u0148uje m\u011B\u0159en\u00ED v\u00FD\u0161kov\u00E9ho profilu jak drsn\u00FDch tak i hladk\u00FDch povrch\u016F. Velmi n\u00EDzk\u00E1 nejistota m\u011B\u0159en\u00ED je nez\u00E1visl\u00E1 na m\u011B\u0159\u00EDc\u00EDm rozsahu a z\u00E1rove\u0148 je odstran\u011Bn probl\u00E9m nejednozna\u010Dnosti m\u011B\u0159en\u00ED"@cs . "Height profile measurement by means of white light interferometry"@en . . "RIV/68378271:_____/03:00100119!RIV/2005/AV0/A02005/N" . "608723" . "Height profile measurement by means of white light interferometry" . "P(LN00A015), Z(AV0Z1010921)" . .