"N/A" . "Ji\u0159\u00ED\u010Dek, Petr" . . "In the present work, systematic study has been carried out on the influence of surface roughness on the electron IMFPs determined by the EPES method using a Cu standard."@en . . "In the present work, systematic study has been carried out on the influence of surface roughness on the electron IMFPs determined by the EPES method using a Cu standard." . "Surface and Interface Analysis" . . "0"^^ . "4"^^ . "0"^^ . "[53EAFAE6650B]" . "Z(AV0Z1010914)" . . . "0142-2421" . . . "34" . "Elastic electron backscattering from silicon surfaces: effect of surface roughness." . "215;219" . "2"^^ . . "electron elastic backscattering intensity; elastic peak electron spectroscopy; EPES"@en . . "644668" . . "Zemek, Josef" . "GB - Spojen\u00E9 kr\u00E1lovstv\u00ED Velk\u00E9 Brit\u00E1nie a Severn\u00EDho Irska" . . . . "Elastic electron backscattering from silicon surfaces: effect of surface roughness."@en . "Lesiak, B." . . "Elastic electron backscattering from silicon surfaces: effect of surface roughness."@en . "Jablonski, A." . . . "Elastic electron backscattering from silicon surfaces: effect of surface roughness." . "5"^^ . "RIV/68378271:_____/02:02020165!RIV/2003/AV0/A02003/N" . "RIV/68378271:_____/02:02020165" .