"127631" . "Skalsk\u00FD dv\u016Fr" . "Brno" . . "978-80-87441-07-7" . "Mika, Filip" . "Signal trajectories of secondary (SE) and backscattered electrons (BSE) were simulated for two cases: an immersion magnetic objective lens (OL) alone and for the case when an electrostatic immersion objective lens is added. Micrographs of a semiconductor structure are presented for these two set-ups." . . "Collection contrast in the immersion objective lens of the scanning electron microscope"@en . . . . "2012-06-25+02:00"^^ . "[50AC3252C2BF]" . . "I, P(FR-TI3/323)" . . "2"^^ . "Institute of Scientific Instruments AS CR, v.v.i" . . . . . "Signal trajectories of secondary (SE) and backscattered electrons (BSE) were simulated for two cases: an immersion magnetic objective lens (OL) alone and for the case when an electrostatic immersion objective lens is added. Micrographs of a semiconductor structure are presented for these two set-ups."@en . . "Konvalina, Ivo" . . "Collection contrast in the immersion objective lens of the scanning electron microscope" . . "Collection contrast in the immersion objective lens of the scanning electron microscope" . "M\u00FCllerov\u00E1, Ilona" . . "Collection contrast in the immersion objective lens of the scanning electron microscope"@en . . "RIV/68081731:_____/12:00386394" . . "RIV/68081731:_____/12:00386394!RIV13-AV0-68081731" . . "scanning electron microscope; collection contrast"@en . "Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation" . "3"^^ . . "3"^^ .