. . "Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22" . . . "Methods employing the emission of backscattered electrons from surfaces of materials in determination of their chemical composition and crystallinic and electronic structures are summarized."@en . . "Backscattered electrons in examination of materials"@en . "RIV/68081731:_____/12:00379918!RIV13-GA0-68081731" . "[5E19293E47E4]" . "4"^^ . "124368" . . "978-1-74052-245-8" . . "Matsuda, K." . "Frank, Lud\u011Bk" . . "I, P(GAP108/11/2270)" . . "5"^^ . "Backscattered electrons in examination of materials"@en . "Pokorn\u00E1, Zuzana" . "Perth" . . . . . "2"^^ . "Mikmekov\u00E1, \u0160\u00E1rka" . . "RIV/68081731:_____/12:00379918" . . . "scanning electron microscope; backscattered electrons; cathode lens"@en . . . . . "Backscattered electrons in examination of materials" . "Wembley" . "Methods employing the emission of backscattered electrons from surfaces of materials in determination of their chemical composition and crystallinic and electronic structures are summarized." . . "Backscattered electrons in examination of materials" . "EECW Pty Ltd" . "M\u00FCllerov\u00E1, Ilona" . "2012-02-05+01:00"^^ .