. "Konvalina, Ivo" . . "2012-02-05+01:00"^^ . "Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22" . "4"^^ . . "Approaches to the Collection Contrast in the Immersion Objective Lens of the Scanning Electron Microscope" . . "Hovorka, Milo\u0161" . "978-1-74052-245-8" . "4"^^ . "Mika, Filip" . "RIV/68081731:_____/12:00379916!RIV12-AV0-68081731" . "Approaches to the Collection Contrast in the Immersion Objective Lens of the Scanning Electron Microscope"@en . "RIV/68081731:_____/12:00379916" . "Approaches to the Collection Contrast in the Immersion Objective Lens of the Scanning Electron Microscope" . . . . "scanning electron microscopy; cathode lens; secondary electrons; backscattered electrons"@en . . "Perth" . "123473" . . . "Approaches to the Collection Contrast in the Immersion Objective Lens of the Scanning Electron Microscope"@en . "Signal trajectories of secondary (SE) and backscattered electrons (BSE) were simulated for two cases: an immersion magnetic objective lens alone and for the case when an electrostatic immersion objective lens is added. Micrographs of a semiconductor structure are presented for these two set-ups." . "2"^^ . . . . . "I, P(FR-TI3/323)" . . . "[FCD81EE5A258]" . "Signal trajectories of secondary (SE) and backscattered electrons (BSE) were simulated for two cases: an immersion magnetic objective lens alone and for the case when an electrostatic immersion objective lens is added. Micrographs of a semiconductor structure are presented for these two set-ups."@en . . . "Wembley" . "M\u00FCllerov\u00E1, Ilona" . . . . . "EECW Pty Ltd" .