. "Syst\u00E9m pro bezkontaktn\u00ED kalibraci koncov\u00FDch m\u011Brek kombinuj\u00EDc\u00ED princip interferometrie n\u00EDzk\u00E9 koherence a laserov\u00E9 interferometrie. Realizovan\u00E9 uspo\u0159\u00E1d\u00E1n\u00ED kombinuje Dowell\u016Fv a Michelson\u016Fv interferometr pro zaji\u0161t\u011Bn\u00ED stanoven\u00ED d\u00E9lky koncov\u00E9 m\u011Brky s p\u0159\u00EDmou n\u00E1vaznost\u00ED na prim\u00E1rn\u00ED norm\u00E1l d\u00E9lky. Monitorov\u00E1n\u00ED \u010Del m\u011Brky digit\u00E1ln\u00ED kamerou umo\u017E\u0148uje rovn\u011B\u017E 3D diagnostiku povrchu \u010Del m\u011Brky. Princip m\u011B\u0159en\u00ED je chr\u00E1n\u011Bn \u010Desk\u00FDm patentem \u010D. 302948."@cs . "Syst\u00E9m pro bezkontaktn\u00ED diagnostiku koncov\u00FDch m\u011Brek"@cs . "\u00DAstav p\u0159\u00EDstrojov\u00E9 techniky AV \u010CR, v. v. i." . . "System for contactless gauge blocks diagnostics"@en . "Funk\u010Dn\u00ED vzorek realizovan\u00FD p\u0159i \u0159e\u0161en\u00ED grantu s p\u0159edpokladem smluvn\u00EDho vyu\u017Eit\u00ED s ekonomick\u00FDm p\u0159\u00EDnosem i po jeho ukon\u010Den\u00ED." . "[0B394D8B2A18]" . . . "RIV/68081731:_____/11:00375766!RIV12-MSM-68081731" . . . . . "2011-03" . . . . . "234009" . . "System for contactless gauge block calibration combines low-coherence interferometry and laser interferometry. An designed setup combines Dowell interferometer and Michelson interferometer to ensure a gauge block length determination with direct traceability to the primary length standard. By monitoring both gauge block sides with a digital camera gauge block 3D surface measurements are possible too. The principle presented is protected by the Czech national patent No. 302948."@en . "Mikel, B\u0159etislav" . "Buchta, Zden\u011Bk" . . "Lazar, Josef" . "Syst\u00E9m pro bezkontaktn\u00ED diagnostiku koncov\u00FDch m\u011Brek" . . "\u010C\u00EDp, Ond\u0159ej" . . . . "P(2A-1TP1/127), P(ED0017/01/01), Z(AV0Z20650511)" . "Funk\u010Dn\u00ED vzorek realizovan\u00FD v r\u00E1mci \u0159e\u0161en\u00ED grantu: bezkontaktn\u00ED kalibrace m\u011Brek do 100 mm d\u00E9lky, kapacita a\u017E 126 kus\u016F m\u011Brek v jednom m\u011B\u0159en\u00ED. Uzav\u0159ena Smlouva o vyu\u017Eit\u00ED v\u00FDsledku s MPO ze dne 30.6.2011." . "Syst\u00E9m pro bezkontaktn\u00ED diagnostiku koncov\u00FDch m\u011Brek"@cs . . "RIV/68081731:_____/11:00375766" . . "5"^^ . . . . "System for contactless gauge blocks diagnostics"@en . . "Syst\u00E9m pro bezkontaktn\u00ED diagnostiku koncov\u00FDch m\u011Brek" . "low-coherence interferometry; gauge block; nanometrology"@en . . . . "5"^^ . "\u010C\u00ED\u017Eek, Martin" . "Syst\u00E9m pro bezkontaktn\u00ED kalibraci koncov\u00FDch m\u011Brek kombinuj\u00EDc\u00ED princip interferometrie n\u00EDzk\u00E9 koherence a laserov\u00E9 interferometrie. Realizovan\u00E9 uspo\u0159\u00E1d\u00E1n\u00ED kombinuje Dowell\u016Fv a Michelson\u016Fv interferometr pro zaji\u0161t\u011Bn\u00ED stanoven\u00ED d\u00E9lky koncov\u00E9 m\u011Brky s p\u0159\u00EDmou n\u00E1vaznost\u00ED na prim\u00E1rn\u00ED norm\u00E1l d\u00E9lky. Monitorov\u00E1n\u00ED \u010Del m\u011Brky digit\u00E1ln\u00ED kamerou umo\u017E\u0148uje rovn\u011B\u017E 3D diagnostiku povrchu \u010Del m\u011Brky. Princip m\u011B\u0159en\u00ED je chr\u00E1n\u011Bn \u010Desk\u00FDm patentem \u010D. 302948." .