"[7270D216128B]" . . "Unconventional Imaging with Backscattered Electrons" . "Hovorka, Milo\u0161" . . "US - Spojen\u00E9 st\u00E1ty americk\u00E9" . "Microscopy and Microanalysis" . "Unconventional Imaging with Backscattered Electrons"@en . "2"^^ . . "Mikmekov\u00E1, \u0160\u00E1rka" . . . . . "236783" . . "1431-9276" . "10.1017/S143192761100537X" . "Z(AV0Z20650511)" . . "Immesrsion of the sample in a scanning electron microscope to strong electric field enables one to acquire the backscattered electrons (BSE) throughout full energy and angle range of emission. BSE emitted at high angles off the surface normal provide extended crystallographic information with high grain contrast sensitive to details including visualization of the internal stress. At very low energies the BSE yield may serve as fingerprinting the grain orientation. The dopant contrast can be obtained via injection of very slow electrons."@en . "4"^^ . "SEM; low energies; grain contrast; dopant contrast; internal stress"@en . "M\u00FCllerov\u00E1, Ilona" . "RIV/68081731:_____/11:00367773!RIV12-AV0-68081731" . . "Immesrsion of the sample in a scanning electron microscope to strong electric field enables one to acquire the backscattered electrons (BSE) throughout full energy and angle range of emission. BSE emitted at high angles off the surface normal provide extended crystallographic information with high grain contrast sensitive to details including visualization of the internal stress. At very low energies the BSE yield may serve as fingerprinting the grain orientation. The dopant contrast can be obtained via injection of very slow electrons." . "Suppl. 2" . "4"^^ . . . . . "Unconventional Imaging with Backscattered Electrons"@en . . . "17" . . "Frank, Lud\u011Bk" . "Unconventional Imaging with Backscattered Electrons" . . . "RIV/68081731:_____/11:00367773" . . .