. "5"^^ . "Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation" . . "5"^^ . . . . . "M\u00FCllerov\u00E1, Ilona" . . "Konvalina, Ivo" . "Prospects of the scanning low energy electron microscopy in materials science" . "Brno" . . "283001" . . "Prospects of the scanning low energy electron microscopy in materials science"@en . "Frank, Lud\u011Bk" . . . . . "Hovorka, Milo\u0161" . . . . "scanning low energy electron microscopy; scanning electron microscopy; transmission electron microscopy; focused ion beam microscopy; cathode lens mode"@en . . "The use of the scanning low energy electron microscopy (SLEEM) has been slowly making its way into the field of materials science, hampered not by limitations in the technique but rather by the relative scarcity of these instruments in research institutes and laboratories. Various techniques exist which are capable of studying the material microstructure, with the scanning electron microscopy (SEM), (scanning) transmission microscopy ((S)TEM) and focused ion beam (FIB) microscopy being perhaps the most known. A specific way to visualizing the microstructure of materials at high spatial resolution, to achieve a high contrast between grains in polycrystals and very fast data acquisition is to use the cathode lens (CL) mode in SEM. The CL mode in the SEM enables us to detect slow but not only slow, high angle scattered electrons that carry mainly crystallographic contrast based on the electron channeling, mostly in the Mott scattering angular range."@en . "RIV/68081731:_____/10:00350665!RIV11-MSM-68081731" . "2010-05-31+02:00"^^ . "P(OE08012), Z(AV0Z20650511)" . "Skalsk\u00FD dv\u016Fr" . . "The use of the scanning low energy electron microscopy (SLEEM) has been slowly making its way into the field of materials science, hampered not by limitations in the technique but rather by the relative scarcity of these instruments in research institutes and laboratories. Various techniques exist which are capable of studying the material microstructure, with the scanning electron microscopy (SEM), (scanning) transmission microscopy ((S)TEM) and focused ion beam (FIB) microscopy being perhaps the most known. A specific way to visualizing the microstructure of materials at high spatial resolution, to achieve a high contrast between grains in polycrystals and very fast data acquisition is to use the cathode lens (CL) mode in SEM. The CL mode in the SEM enables us to detect slow but not only slow, high angle scattered electrons that carry mainly crystallographic contrast based on the electron channeling, mostly in the Mott scattering angular range." . "[16D54E418E77]" . "RIV/68081731:_____/10:00350665" . . "Mikmekov\u00E1, \u0160\u00E1rka" . . "Prospects of the scanning low energy electron microscopy in materials science" . "Prospects of the scanning low energy electron microscopy in materials science"@en . . . . . "Institute of Scientific Instruments AS CR, v.v.i" . "978-80-254-6842-5" . "2"^^ .