"P(IAA100650803), Z(AV0Z20650511)" . . "Zobrazen\u00ED dopovan\u00E9ho k\u0159em\u00EDku na velmi n\u00EDzk\u00FDch energi\u00EDch pomoc\u00ED rastrovac\u00EDho elektronov\u00E9ho mikroskopu"@cs . . "SLEEM; dopant; silicon"@en . . . "Scanning Low Energy Electron Microscopy of Doped Silicon at Units of EV" . . "[BEF1205EE0D4]" . "Frank, Lud\u011Bk" . . "Scanning Low Energy Electron Microscopy of Doped Silicon at Units of EV" . "Mikmekov\u00E1, \u0160\u00E1rka" . . . . "Zobrazen\u00ED dopovan\u00E9ho k\u0159em\u00EDku na velmi n\u00EDzk\u00FDch energi\u00EDch pomoc\u00ED rastrovac\u00EDho elektronov\u00E9ho mikroskopu"@cs . . "3"^^ . "Institute of Scientific Instruments AS CR, v.v.i" . . "RIV/68081731:_____/08:00315452" . "3"^^ . "RIV/68081731:_____/08:00315452!RIV09-AV0-68081731" . "Scanning Low Energy Electron Microscopy of Doped Silicon at Units of EV"@en . "2"^^ . . . . . "Proceedings of the 11th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation" . "Skalsk\u00FD dv\u016Fr" . . "Hovorka, Milo\u0161" . "Brno" . "Scanning low energy electron microscope equipped with cathode lens was employed in observation of differently doped areas in silicon imaged at units of eV. The phenomena connected with injected charge, contamination and modulation of electron reflectivity are discussed." . "Rastrovac\u00ED elektronov\u00FD mikroskop vybaven\u00FD katodovou \u010Do\u010Dkou byl pou\u017Eit pro studium k\u0159em\u00EDku s r\u016Fzn\u011B dopovan\u00FDmi oblastmi, kter\u00E9 byly zobrazeny na velmi n\u00EDzk\u00FDch energi\u00EDch (jednotky eV). Jsou diskutov\u00E1ny jevy souvisej\u00EDc\u00ED s injektovan\u00FDm n\u00E1bojem, kontaminac\u00ED a modulac\u00ED reflektivity sign\u00E1ln\u00EDch elektron\u016F."@cs . . . "978-80-254-0905-3" . "Scanning Low Energy Electron Microscopy of Doped Silicon at Units of EV"@en . "2008-07-14+02:00"^^ . . "Scanning low energy electron microscope equipped with cathode lens was employed in observation of differently doped areas in silicon imaged at units of eV. The phenomena connected with injected charge, contamination and modulation of electron reflectivity are discussed."@en . . "393839" .