"2"^^ . . "Byla vyvinuta a ov\u011B\u0159ena metodika objektivn\u00EDho hodnocen\u00ED parametr\u016F detektor\u016F sekund\u00E1rn\u00EDch elektron\u016F v rastrovac\u00EDch elektronov\u00FDch mikroskopech cestou m\u011B\u0159en\u00ED kvantov\u00E9 detek\u010Dn\u00ED \u00FA\u010Dinnosti DQE. Statick\u00E9 m\u011B\u0159en\u00ED \u010Detnosti ztr\u00E1t informaci nesouc\u00EDch ud\u00E1lost\u00ED (elektron\u016F emitovan\u00FDch ze vzorku) je zalo\u017Eeno na statistick\u00E9m vyhodnocen\u00ED obrazu sejmut\u00E9ho z bezkontrastov\u00E9ho prepar\u00E1tu. Rychlost odezvy detektoru je m\u011B\u0159ena statistick\u00FDm vyhodnocen\u00EDm obrazu sejmut\u00E9ho pomoc\u00ED svazku p\u0159eru\u0161ovan\u00E9ho rychl\u00FDm zatm\u00EDv\u00E1n\u00EDm." . "529781" . "M\u00FCllerov\u00E1, Ilona" . "[1D1D3BFA63C3]" . . . "FEI \u010Cesk\u00E1 republika, Brno" . . "Z(AV0Z20650511)" . "Metoda objektivn\u00EDho hodnocen\u00ED a postup m\u011B\u0159en\u00ED kvantov\u00E9 detek\u010Dn\u00ED \u00FA\u010Dinnosti detektoru sekund\u00E1rn\u00EDch elektron\u016F v rastrovac\u00EDm elektronov\u00E9m mikroskopu ve statick\u00E9m re\u017Eimu stabiln\u00EDho sign\u00E1lu a procedura vyhodnocen\u00ED \u010Dasov\u00E9 odezvy detektoru na sign\u00E1lov\u00FD skok." . "Methodology has been developed and proved for objective evaluation of parameters of the secondary electron detectors for scanning electron microscopes by means of measurement of the detective quantum efficiency DQE. Static measurement of the rate of losses in information bearing events (electrons emitted from the sample) is based on statistical evaluation of an image acquired with a contrast-less sample. Speed of the detector response is determined upon statistical evaluations of an image taken with the beam interrupted by fast blanking."@en . . "RIV/68081731:_____/05:00047349!RIV06-AV0-68081731" . "Metoda m\u011B\u0159en\u00ED detek\u010Dn\u00ED \u00FA\u010Dinnosti detektoru sekund\u00E1rn\u00EDch elektron\u016F v rastrovac\u00EDm elektronov\u00E9m mikroskopu" . . . "RIV/68081731:_____/05:00047349" . . . . . "Method for quantification of the detection efficiency of secondary electron detectors in the scanning electron microscope"@en . "Metoda m\u011B\u0159en\u00ED detek\u010Dn\u00ED \u00FA\u010Dinnosti detektoru sekund\u00E1rn\u00EDch elektron\u016F v rastrovac\u00EDm elektronov\u00E9m mikroskopu"@cs . . . . "Metoda m\u011B\u0159en\u00ED detek\u010Dn\u00ED \u00FA\u010Dinnosti detektoru sekund\u00E1rn\u00EDch elektron\u016F v rastrovac\u00EDm elektronov\u00E9m mikroskopu" . . . "Metoda umo\u017E\u0148uje objektivn\u00ED srovn\u00E1n\u00ED r\u016Fzn\u00FDch konfigurac\u00ED detektor\u016F a rovn\u011B\u017E vyhodnocov\u00E1n\u00ED efektu konstruk\u010Dn\u00EDch zm\u011Bn a inovac\u00ED." . "Frank, Lud\u011Bk" . . "DETEFF" . "2"^^ . "electron detectors; scanning electron microscope; detective quantum efficiency; secondary electrons"@en . . "Byla vyvinuta a ov\u011B\u0159ena metodika objektivn\u00EDho hodnocen\u00ED parametr\u016F detektor\u016F sekund\u00E1rn\u00EDch elektron\u016F v rastrovac\u00EDch elektronov\u00FDch mikroskopech cestou m\u011B\u0159en\u00ED kvantov\u00E9 detek\u010Dn\u00ED \u00FA\u010Dinnosti DQE. Statick\u00E9 m\u011B\u0159en\u00ED \u010Detnosti ztr\u00E1t informaci nesouc\u00EDch ud\u00E1lost\u00ED (elektron\u016F emitovan\u00FDch ze vzorku) je zalo\u017Eeno na statistick\u00E9m vyhodnocen\u00ED obrazu sejmut\u00E9ho z bezkontrastov\u00E9ho prepar\u00E1tu. Rychlost odezvy detektoru je m\u011B\u0159ena statistick\u00FDm vyhodnocen\u00EDm obrazu sejmut\u00E9ho pomoc\u00ED svazku p\u0159eru\u0161ovan\u00E9ho rychl\u00FDm zatm\u00EDv\u00E1n\u00EDm."@cs . . "Metoda m\u011B\u0159en\u00ED detek\u010Dn\u00ED \u00FA\u010Dinnosti detektoru sekund\u00E1rn\u00EDch elektron\u016F v rastrovac\u00EDm elektronov\u00E9m mikroskopu"@cs . "Method for quantification of the detection efficiency of secondary electron detectors in the scanning electron microscope"@en . .