"Environment\u00E1ln\u00ED rastrovac\u00ED elektronov\u00FD mikroskop AQUASEM-II byl postaven na UPT AV\u010CR, \u010D\u00EDm\u017E byly u\u0161et\u0159eny vysok\u00E9 n\u00E1klady na po\u0159\u00EDzen\u00ED obdobn\u00E9ho za\u0159\u00EDzen\u00ED." . "RIV/68081731:_____/04:00047189" . . "P(IBS2065107)" . . . "Environment\u00E1ln\u00ED rastrovac\u00ED elektronov\u00FD mikroskop AQUASEM-II" . "Environmental scanning electron microscope AQUASEM-II"@en . "\u00DAPT AV \u010CR, Brno" . "A microscope enabling observation of specimens at high vacuum conditions with the resolution of 5 nm and the accelerating voltage of 25 kV has been taken to operation. This microscope also enables observation of wet samples at a pressure of 2000 Pa in the specimen chamber. An optical system of the VEGA type, under which is inbuilt a differential chamber with the scintillation detector of backscattered electrons and a ionisation detector of secondary electrons is employed in the microscope. The microscope is equipped with a device for preservation of permanent wetness of samples and the Peltie cell for their cooling down to -20\u00B0C. The detection system is equipped with software. The measurement of pressure in the specimen chamber, in the differential chamber and in the column of the microscope has been adjusted. The microscope is a universal instrument for observation of all types of both conductive and nonconductive samples."@en . . "Ned\u011Bla, Vil\u00E9m" . . . . . . "Byl uveden do rutinn\u00ED \u010Dinnosti univerz\u00E1ln\u00ED rastrovac\u00ED elektronov\u00FD mikroskop vlastn\u00ED konstrukce, kter\u00FD umo\u017E\u0148uje pozorovat vodiv\u00E9 nebo nevodiv\u00E9 vzorky a vzorky s r\u016Fzn\u00FDm stupn\u011Bm vlhkosti bu\u010F ve vysok\u00E9m vakuu, nebo ve vysok\u00E9m tlaku komory vzorku." . "Byl pln\u011B uveden do \u010Dinnosti mikroskop, kter\u00FD umo\u017E\u0148uje pozorov\u00E1n\u00ED vzork\u016F ve vysokovakuov\u00FDch podm\u00EDnk\u00E1ch s rozli\u0161en\u00EDm 5nm p\u0159i urychlovac\u00EDm nap\u011Bt\u00ED 25kV. Sou\u010Dasn\u011B tento mikroskop dovoluje pozorovat vlhk\u00E9 vzorky p\u0159i tlaku ve vzorkov\u00E9 komo\u0159e 2000Pa. V mikroskopu je vyu\u017Eita optick\u00E1 soustava tipu VEGA, pod n\u00ED\u017E je zabudovan\u00E1 diferenci\u00E1ln\u00ED komora se scintila\u010Dn\u00EDm detektorem zp\u011Btn\u011B odra\u017Een\u00FDch elektron\u016F a ioniza\u010Dn\u00EDm detektorem sekund\u00E1rn\u00EDch elektron\u016F. Mikroskop je d\u00E1le vybaven za\u0159\u00EDzen\u00EDm pro udr\u017Eov\u00E1n\u00ED trval\u00E9 vlhkosti vzork\u016F a Peltierov\u00FDm \u010Dl\u00E1nkem pro jejich chlazen\u00ED a\u017E do -20\u00B0C. Detek\u010Dn\u00ED syst\u00E9m je softwarov\u011B vybaven. Je adjustov\u00E1no m\u011B\u0159en\u00ED tlaku v komo\u0159e vzorku, v diferenci\u00E1ln\u00ED komo\u0159e a v tubusu mikroskopu. Mikroskop je univerz\u00E1ln\u00EDm za\u0159\u00EDzen\u00EDm pro pozorov\u00E1n\u00ED v\u0161ech tip\u016F nevodiv\u00FDch a vodiv\u00FDch vzork\u016F."@cs . . "Environment\u00E1ln\u00ED rastrovac\u00ED elektronov\u00FD mikroskop AQUASEM-II" . "[B2FB3050804E]" . "RIV/68081731:_____/04:00047189!RIV06-AV0-68081731" . . . "environmental SEM; water vapour; insulating specimen"@en . "Autrata, Rudolf" . "Environment\u00E1ln\u00ED rastrovac\u00ED elektronov\u00FD mikroskop AQUASEM-II"@cs . . "562996" . "Environment\u00E1ln\u00ED rastrovac\u00ED elektronov\u00FD mikroskop AQUASEM-II"@cs . . "AQUASEM" . . . "Byl pln\u011B uveden do \u010Dinnosti mikroskop, kter\u00FD umo\u017E\u0148uje pozorov\u00E1n\u00ED vzork\u016F ve vysokovakuov\u00FDch podm\u00EDnk\u00E1ch s rozli\u0161en\u00EDm 5nm p\u0159i urychlovac\u00EDm nap\u011Bt\u00ED 25kV. Sou\u010Dasn\u011B tento mikroskop dovoluje pozorovat vlhk\u00E9 vzorky p\u0159i tlaku ve vzorkov\u00E9 komo\u0159e 2000Pa. V mikroskopu je vyu\u017Eita optick\u00E1 soustava tipu VEGA, pod n\u00ED\u017E je zabudovan\u00E1 diferenci\u00E1ln\u00ED komora se scintila\u010Dn\u00EDm detektorem zp\u011Btn\u011B odra\u017Een\u00FDch elektron\u016F a ioniza\u010Dn\u00EDm detektorem sekund\u00E1rn\u00EDch elektron\u016F. Mikroskop je d\u00E1le vybaven za\u0159\u00EDzen\u00EDm pro udr\u017Eov\u00E1n\u00ED trval\u00E9 vlhkosti vzork\u016F a Peltierov\u00FDm \u010Dl\u00E1nkem pro jejich chlazen\u00ED a\u017E do -20\u00B0C. Detek\u010Dn\u00ED syst\u00E9m je softwarov\u011B vybaven. Je adjustov\u00E1no m\u011B\u0159en\u00ED tlaku v komo\u0159e vzorku, v diferenci\u00E1ln\u00ED komo\u0159e a v tubusu mikroskopu. Mikroskop je univerz\u00E1ln\u00EDm za\u0159\u00EDzen\u00EDm pro pozorov\u00E1n\u00ED v\u0161ech tip\u016F nevodiv\u00FDch a vodiv\u00FDch vzork\u016F." . "2"^^ . . . "Environmental scanning electron microscope AQUASEM-II"@en . "2"^^ .