. "\u00DAPT AV \u010CR, Brno" . . "Aparatura pro m\u011B\u0159en\u00ED tot\u00E1ln\u00EDch hemisf\u00E9rick\u00FDch emisivit a absorptivit tepeln\u00E9ho z\u00E1\u0159en\u00ED p\u0159i kryogenn\u00EDch teplot\u00E1ch"@cs . "Aparatura pro m\u011B\u0159en\u00ED tot\u00E1ln\u00EDch hemisf\u00E9rick\u00FDch emisivit a absorptivit tepeln\u00E9ho z\u00E1\u0159en\u00ED p\u0159i kryogenn\u00EDch teplot\u00E1ch" . "Apparatus for the measurement of total hemispherical emissivity and absorptivity of radiative heat at cryogenic temperatures"@en . . . "Byla vyvinuta aparatura pro m\u011B\u0159en\u00ED tot\u00E1ln\u00EDch hemisf\u00E9rick\u00FDch emisivit a absorptivit tepeln\u00E9ho z\u00E1\u0159en\u00ED p\u0159i kryogenn\u00EDch teplot\u00E1ch. Teplotn\u00ED z\u00E1vislosti emisivit a absorptivit pro r\u016Fzn\u00E9 materi\u00E1ly je mo\u017En\u00E9 m\u011B\u0159it standardn\u011B v rozsahu teplot 20 \u2013 140 K, v n\u011Bkter\u00FDch p\u0159\u00EDpadech lze teplotn\u00ED rozsah roz\u0161\u00ED\u0159it na 5 \u2013 300 K. M\u011B\u0159en\u00E9 vzorky materi\u00E1l\u016F mus\u00ED b\u00FDt rovinn\u00E9 s pr\u016Fm\u011Brem 40 mm. Obdobn\u00E9 m\u011B\u0159\u00EDc\u00ED za\u0159\u00EDzen\u00ED nebylo publikov\u00E1no."@cs . . "EMISTER" . . "liquid helium; absorptivity; emissivity; heat flow; heat radiation; cryogenics"@en . "4"^^ . "Aparatura pro m\u011B\u0159en\u00ED tot\u00E1ln\u00EDch hemisf\u00E9rick\u00FDch emisivit a absorptivit tepeln\u00E9ho z\u00E1\u0159en\u00ED p\u0159i kryogenn\u00EDch teplot\u00E1ch"@cs . . "Musilov\u00E1, V\u011Bra" . "Aparatura pro m\u011B\u0159en\u00ED tot\u00E1ln\u00EDch hemisf\u00E9rick\u00FDch emisivit a absorptivit tepeln\u00E9ho z\u00E1\u0159en\u00ED p\u0159i kryogenn\u00EDch teplot\u00E1ch" . "4"^^ . "Zm\u011B\u0159en\u00E9 hodnoty emisivity a absorptivity konkr\u00E9tn\u00EDch materi\u00E1l\u016F umo\u017E\u0148uj\u00ED p\u0159esn\u00FD v\u00FDpo\u010Det i optimalizaci navrhovan\u00FDch kryogenn\u00EDch za\u0159\u00EDzen\u00ED. Je mo\u017En\u00E9 realizovat m\u011B\u0159en\u00ED emisivit a absorptivit vybran\u00FDch materi\u00E1l\u016F na zak\u00E1zku." . . "Hanzelka, Pavel" . "Za\u0159\u00EDzen\u00ED umo\u017E\u0148uje m\u011B\u0159en\u00ED tot\u00E1ln\u00ED hemisf\u00E9rick\u00E9 emisivity (vzorek jako z\u00E1\u0159i\u010D) nebo absorptivity (vzorek jako p\u0159ij\u00EDma\u010D) plynule v rozsahu teplot 20 \u2013 300 K. Rovinn\u00FD vzorek m\u00E1 tvar kruhu o pr\u016Fm\u011Bru 40 mm." . . . . . "Srnka, Ale\u0161" . "RIV/68081731:_____/04:00047188!RIV06-AV0-68081731" . . "Kr\u00E1l\u00EDk, Tom\u00E1\u0161" . . "Apparatus for the measurement of total hemispherical emissivity and absorptivity of radiative heat at cryogenic temperatures"@en . "Apparatus for the measurement of total hemispherical emissivity and absorptivity of radiative heat at cryogenic temperatures was developed. Temperature dependence of those for various materials are measured standardly at the temperature region 20 \u2013140 K and may be enhanced to 5 \u2013300 K in some cases. Samples of materials measured must be plane and with diameter of 40 mm. Similar measurement apparatus was not published."@en . . "RIV/68081731:_____/04:00047188" . . "554884" . "P(IBS2065109)" . . . "[225D5BCE1747]" . . . . . "Byla vyvinuta aparatura pro m\u011B\u0159en\u00ED tot\u00E1ln\u00EDch hemisf\u00E9rick\u00FDch emisivit a absorptivit tepeln\u00E9ho z\u00E1\u0159en\u00ED p\u0159i kryogenn\u00EDch teplot\u00E1ch. Teplotn\u00ED z\u00E1vislosti emisivit a absorptivit pro r\u016Fzn\u00E9 materi\u00E1ly je mo\u017En\u00E9 m\u011B\u0159it standardn\u011B v rozsahu teplot 20 \u2013 140 K, v n\u011Bkter\u00FDch p\u0159\u00EDpadech lze teplotn\u00ED rozsah roz\u0161\u00ED\u0159it na 5 \u2013 300 K. M\u011B\u0159en\u00E9 vzorky materi\u00E1l\u016F mus\u00ED b\u00FDt rovinn\u00E9 s pr\u016Fm\u011Brem 40 mm. Obdobn\u00E9 m\u011B\u0159\u00EDc\u00ED za\u0159\u00EDzen\u00ED nebylo publikov\u00E1no." . .