. . "P(GA102/02/1318), P(GP102/02/P122), P(IAB2065001), P(IBS2065009), Z(AV0Z2065902)" . "Frequency method of sub-nanometer distance measurement using the optical resonator and tunable semiconductor laser." . "Lazar, Josef" . . . "RIV/68081731:_____/02:12020137" . . "Frequency method of sub-nanometer distance measurement using the optical resonator and tunable semiconductor laser."@en . "Frequency method of sub-nanometer distance measurement using the optical resonator and tunable semiconductor laser." . . . . "RIV/68081731:_____/02:12020137!RIV/2003/AV0/A12003/N" . . . "4"^^ . "3"^^ . "Petr\u016F, Franti\u0161ek" . . . "Proceedings of the general assembly of the international union of radio science." . "3"^^ . "0"^^ . "0"^^ . . "distance measurement; tunable semiconductor laser; Michelson interferometer"@en . "Maastricht [NL]" . . "X1-X5" . "\u010C\u00EDp, Ond\u0159ej" . . . "646589" . . "Several methods of scale non-linearity measurements of Michelson interferometers have been presented but their uncertainty is comparable approximately with the total resolution of the interferometers. We developed and experimentally verified a new method where order-times smaller uncertainty of the distance measurement is possible. The method takes advantage of a direct conversion of the relative changes of the optical path in measuring arm of the Michelson interferometer to relative changes of the resonant optical frequency of the Fabry-Pert resonator. Frequency changes of the resonator have been monitored by a beat-frequency comparson between tunable semiconductor laser and HeNeI.sub.2./sub. optical frequency standard at 633 nm." . . "Frequency method of sub-nanometer distance measurement using the optical resonator and tunable semiconductor laser."@en . . "Neuveden" . . "2002-08-17+02:00"^^ . . . "Several methods of scale non-linearity measurements of Michelson interferometers have been presented but their uncertainty is comparable approximately with the total resolution of the interferometers. We developed and experimentally verified a new method where order-times smaller uncertainty of the distance measurement is possible. The method takes advantage of a direct conversion of the relative changes of the optical path in measuring arm of the Michelson interferometer to relative changes of the resonant optical frequency of the Fabry-Pert resonator. Frequency changes of the resonator have been monitored by a beat-frequency comparson between tunable semiconductor laser and HeNeI.sub.2./sub. optical frequency standard at 633 nm."@en . . "Maastricht" . "[A9683453CD49]" .