"I" . "[783F817716F8]" . . "RIV/68081723:_____/10:00421391!RIV14-AV0-68081723" . "2010-11-02+01:00"^^ . "x-ray; silicon; defects"@en . "2"^^ . "R\u016F\u017Ei\u010Dka, J." . "Mikul\u00EDk, P." . . "RIV/68081723:_____/10:00421391" . "Bernstorff, S." . "Caha, O." . . "Svoboda, Milan" . . "2"^^ . "Medu\u0148a, M." . "Ro\u017Enov pod Radho\u0161t\u011Bm" . . "Ro\u017Enov pod Radho\u0161t\u011Bm" . . "Two x-ray diffraction methods were used for characterization of the oxide precipitates in Czochralski silicon series of samples. The maping of the diffuse scattering around reciprocal lattice point in Bragg geometry and the simultaneous measurement of the diffracted and transmitted beam intensity in the Laue diffraction geometry."@en . "X-ray scattering study of oxide precipitates in Cz-Si"@en . . "Bur\u0161\u00EDk, Ji\u0159\u00ED" . "978-80-254-7361-0" . "TECON Scientific, s.r.o." . . . "Two x-ray diffraction methods were used for characterization of the oxide precipitates in Czochralski silicon series of samples. The maping of the diffuse scattering around reciprocal lattice point in Bragg geometry and the simultaneous measurement of the diffracted and transmitted beam intensity in the Laue diffraction geometry." . "X-ray scattering study of oxide precipitates in Cz-Si" . "Bernatov\u00E1, S." . "X-ray scattering study of oxide precipitates in Cz-Si"@en . . . . . "299059" . . "SILICON 2010. 12th Scientific and Business Conference" . "8"^^ . . . "X-ray scattering study of oxide precipitates in Cz-Si" .