. "359676" . "ion-surface impact; scattering; silicon; alkali metals"@en . . . . . "000253277900032" . "Charge exchange between low energy Si ions and Cs adatoms" . "NL - Nizozemsko" . . . "RIV/67985882:_____/08:00358922" . "P(IAA1067401), P(MEB060715), Z(AV0Z20670512)" . "\u0160roubek, Zden\u011Bk" . "[9E2DB147F6A1]" . "Charge exchange between low energy Si ions and Cs adatoms"@en . . . "2" . . . . . . . "Surface Science" . . "Yarmoff, J. A." . "Unexpectedly large yields of positive and negative ions are produced when 2 and 5 keV Si+ is singly scattered from Cs adatoms on Al(100) and Si(111).This is in contrast with Li+, in which case the ions are almost completely neutralized. The Si+ ions likely result from valence electron resonant transfer (RCT) enhanced by promotion of the ionization level as it interacts with the Cs 2p level."@en . "Chen, X." . "0039-6028" . "Charge exchange between low energy Si ions and Cs adatoms" . . "602" . "10"^^ . . "Unexpectedly large yields of positive and negative ions are produced when 2 and 5 keV Si+ is singly scattered from Cs adatoms on Al(100) and Si(111).This is in contrast with Li+, in which case the ions are almost completely neutralized. The Si+ ions likely result from valence electron resonant transfer (RCT) enhanced by promotion of the ionization level as it interacts with the Cs 2p level." . "RIV/67985882:_____/08:00358922!RIV11-MSM-67985882" . "Charge exchange between low energy Si ions and Cs adatoms"@en . "1"^^ . . "3"^^ .