. . "Anal\u00FDza vzork\u016F metodou SEM v\u010D. detailn\u00ED interpretace v\u00FDsledk\u016F"@cs . . "Neuveden" . . . . "The object of interest in this project was analysis of API surface by scanning electron microscopy and verification of expected properties."@en . "75"^^ . "Scanning electron microscopy (SEM) analysis of the samples with detail interpretation of results"@en . . "SEM, morphology, API"@en . "15310" . "RIV/61989592:15310/12:33148726!RIV14-MSM-15310___" . "\u0160af\u00E1\u0159ov\u00E1, Kl\u00E1ra" . "122684" . "N" . "RIV/61989592:15310/12:33148726" . "Otyepka, Michal" . . . . "Anal\u00FDza vzork\u016F metodou SEM v\u010D. detailn\u00ED interpretace v\u00FDsledk\u016F" . . "C\u00EDlem projektu bylo ur\u010Den\u00ED vlivu povrchu krystal\u016F l\u00E9\u010Div na funk\u010Dn\u00ED vlastnosti l\u00E1tek na z\u00E1klad\u011B SEM sn\u00EDmk\u016F a ov\u011B\u0159en\u00ED p\u0159edpokl\u00E1dan\u00FDch vlastnost\u00ED a charakteru povrch\u016F API l\u00E1tek." . . "Teva Czech Industries s.r.o., Opava" . . . . "[33D2B9A101BD]" . "Anal\u00FDza vzork\u016F metodou SEM v\u010D. detailn\u00ED interpretace v\u00FDsledk\u016F"@cs . "2"^^ . . "C\u00EDlem projektu bylo ur\u010Den\u00ED vlivu povrchu krystal\u016F l\u00E9\u010Div na funk\u010Dn\u00ED vlastnosti l\u00E1tek na z\u00E1klad\u011B SEM sn\u00EDmk\u016F a ov\u011B\u0159en\u00ED p\u0159edpokl\u00E1dan\u00FDch vlastnost\u00ED a charakteru povrch\u016F API l\u00E1tek."@cs . "Scanning electron microscopy (SEM) analysis of the samples with detail interpretation of results"@en . "Anal\u00FDza vzork\u016F metodou SEM v\u010D. detailn\u00ED interpretace v\u00FDsledk\u016F" . "2"^^ .