"RIV/61989592:15310/12:33148486" . . . . "Anal\u00FDza vzork\u016F feritov\u00FDch jader metodou RTG fluorescen\u010Dn\u00ED spektroskopie, RTG pr\u00E1\u0161kov\u00E9 difrakce a Skenovac\u00ED elektronov\u00E9 mikroskopie pro firmu EPCOS s.r.o." . . . "5"^^ . . . . "RCPTM/3725/2012/2" . "2"^^ . "122682" . "2"^^ . . "\u0160af\u00E1\u0159ov\u00E1, Kl\u00E1ra" . "EPCOS s.r.o. I\u010C: 25569341" . "Analysis of samples of ferrite cores using X-ray fluorescence spectroscopy, X-ray powder diffraction and scanning electron microscopy for the company EPCOS"@en . . "Analysis of samples of ferrite cores using X-ray fluorescence spectroscopy, X-ray powder diffraction and scanning electron microscopy for the company EPCOS"@en . "Anal\u00FDza vzork\u016F feritov\u00FDch jader metodou RTG fluorescen\u010Dn\u00ED spektroskopie, RTG pr\u00E1\u0161kov\u00E9 difrakce a Skenovac\u00ED elektronov\u00E9 mikroskopie pro firmu EPCOS s.r.o."@cs . . "N" . "[8A4D0C8C797D]" . . . "The research carried out under contract from EPCOS company was focused on the development and validation of the methodology determination of low concentrations of Cl and Mo method using X-ray fluorescence spectroscopy. Special standards were created for this purpose which reflect the character of powdered ferrite cores EPCOS and concentration ranges of the elements (in particular their threshold concentrations) and developed standards were compared with standards supplied by EPCOS. Repeated measurements of selected samples were subjected to statistical evaluation to detect possible errors. The atomic structure of critical phases was determined for samples selected by customer using X-ray powder diffraction method. The method of scanning electron microscopy was used additionally to determine the particle size and morphology of studied materials."@en . . . . . . . . . "Filip, Jan" . . . . "15310" . . "Anal\u00FDza vzork\u016F feritov\u00FDch jader metodou RTG fluorescen\u010Dn\u00ED spektroskopie, RTG pr\u00E1\u0161kov\u00E9 difrakce a Skenovac\u00ED elektronov\u00E9 mikroskopie pro firmu EPCOS s.r.o." . . "V\u00FDzkum realizovan\u00FD na z\u00E1klad\u011B zak\u00E1zky od firmy EPCOS s.r.o. byl zam\u011B\u0159en na v\u00FDvoj a ov\u011B\u0159en\u00ED metodiky stanoven\u00ED n\u00EDzk\u00FDch koncentrac\u00ED Cl a Mo vyu\u017E\u00EDvaj\u00EDc\u00ED metodu RTG fluorescen\u010Dn\u00ED spektroskopie. Pro tyto \u00FA\u010Dely byly vytvo\u0159eny speci\u00E1ln\u00ED standardy reflektuj\u00EDc\u00ED charakter pr\u00E1\u0161kov\u00FDch feritov\u00FDch jader firmy EPCOS a koncentra\u010Dn\u00ED rozsahy dan\u00FDch prvk\u016F (zejm\u00E9na jejich prahov\u00E9 koncentrace) a vyvinut\u00E9 standardy byly porovn\u00E1ny se standardy dodan\u00FDmi firmou EPCOS s.r.o. Opakovan\u00E1 m\u011B\u0159en\u00E1 zvolen\u00FDch kritick\u00FDch vzork\u016F byla podrobena statistick\u00E9mu vyhodnocen\u00ED s c\u00EDlem podchycen\u00ED mo\u017En\u00FDch chyb. U zvolen\u00FDch vzork\u016F byla dle zad\u00E1n\u00ED zadavatele zak\u00E1zky stanovena atomov\u00E1 struktura kritick\u00FDch f\u00E1z\u00ED metodou RTG pr\u00E1\u0161kov\u00E9 difrakce. Pro vybran\u00E9 vzorky byla n\u00E1sledn\u011B aplikov\u00E1na metoda skenovac\u00ED elektronov\u00E9 mikroskopie za \u00FA\u010Delem stanoven\u00ED velikosti \u010D\u00E1stic a morfologie podsypov\u00FDch materi\u00E1l\u016F."@cs . "RIV/61989592:15310/12:33148486!RIV14-MSM-15310___" . . "V\u00FDzkum realizovan\u00FD na z\u00E1klad\u011B zak\u00E1zky od firmy EPCOS s.r.o. byl zam\u011B\u0159en na v\u00FDvoj a ov\u011B\u0159en\u00ED metodiky stanoven\u00ED n\u00EDzk\u00FDch koncentrac\u00ED Cl a Mo vyu\u017E\u00EDvaj\u00EDc\u00ED metodu RTG fluorescen\u010Dn\u00ED spektroskopie. Pro tyto \u00FA\u010Dely byly vytvo\u0159eny speci\u00E1ln\u00ED standardy reflektuj\u00EDc\u00ED charakter pr\u00E1\u0161kov\u00FDch feritov\u00FDch jader firmy EPCOS a koncentra\u010Dn\u00ED rozsahy dan\u00FDch prvk\u016F (zejm\u00E9na jejich prahov\u00E9 koncentrace) a vyvinut\u00E9 standardy byly porovn\u00E1ny se standardy dodan\u00FDmi firmou EPCOS s.r.o. Opakovan\u00E1 m\u011B\u0159en\u00E1 zvolen\u00FDch kritick\u00FDch vzork\u016F byla podrobena statistick\u00E9mu vyhodnocen\u00ED s c\u00EDlem podchycen\u00ED mo\u017En\u00FDch chyb. U zvolen\u00FDch vzork\u016F byla dle zad\u00E1n\u00ED zadavatele zak\u00E1zky stanovena atomov\u00E1 struktura kritick\u00FDch f\u00E1z\u00ED metodou RTG pr\u00E1\u0161kov\u00E9 difrakce. Pro vybran\u00E9 vzorky byla n\u00E1sledn\u011B aplikov\u00E1na metoda skenovac\u00ED elektronov\u00E9 mikroskopie za \u00FA\u010Delem stanoven\u00ED velikosti \u010D\u00E1stic a morfologie podsypov\u00FDch materi\u00E1l\u016F." . "EPCOS; company; microscopy; electron; scanning; diffraction; powder; X-ray; spectroscopy; fluorescence; using; cores; ferrite; samples"@en . "Anal\u00FDza vzork\u016F feritov\u00FDch jader metodou RTG fluorescen\u010Dn\u00ED spektroskopie, RTG pr\u00E1\u0161kov\u00E9 difrakce a Skenovac\u00ED elektronov\u00E9 mikroskopie pro firmu EPCOS s.r.o."@cs .