"RIV/61989592:15310/05:00009854!RIV10-MSM-15310___" . . "Possibilities of measuring system NanoTest # NT600"@en . "Boh\u00E1\u010D, P." . "Possibilities of measuring system NanoTest # NT600" . "Nowadays, the technology of thin films is an essential part of many production procedures. It is successfully used for instance in electro technical industry, electronics, optics, mechanical engineering, energrtics and medicine." . "\u010Ctvrtl\u00EDk, Radim" . "4"^^ . . "4"^^ . "0447-6441" . "RIV/61989592:15310/05:00009854" . "Nowadays, the technology of thin films is an essential part of many production procedures. It is successfully used for instance in electro technical industry, electronics, optics, mechanical engineering, energrtics and medicine."@en . . "Possibilities of measuring system NanoTest # NT600" . "Jemn\u00E1 mechanika a optika" . "2"^^ . "CZ - \u010Cesk\u00E1 republika" . . "P(LN00A015)" . . . . "Jastrab\u00EDk, L." . . . . "Possibilities of measuring system NanoTest # NT600"@en . . . "50" . . . "[151C92E7301D]" . "nanoindentace; scratch test; impact test; dynamick\u00E1 tvrdost; pin on disc; akustick\u00E1 emise"@en . "536980" . . "Strany\u00E1nek, Martin" . . "15310" . . . "7-8" . .