"The analysis of the fitness of the Stresstech Microscan 500 device to the study of Barkhausen noise"@en . . . . "Barkhausen noise, StressTech MicroScan 500, numerical analysis"@en . "Pi\u0161tora, Jarom\u00EDr" . "Meranie Barkhausenovho \u0161umu (B\u0160) sa v stroj\u00E1rstve vyu\u017E\u00EDva ako r\u00FDchla, jednoduch\u00E1 a spo\u013Eahliv\u00E1 met\u00F3da na z\u00EDskavanie inform\u00E1ci\u00ED o vlastnostiach opracovan\u00FDch povrchov. Na z\u00E1klade jeho ve\u013Ekosti je mo\u017En\u00E9 odhali\u0165 skryt\u00E9 vady a vy\u010Dleni\u0165 tak zl\u00E9 v\u00FDrobky po\u010Das v\u00FDroby. Pr\u00EDstroj Microscan 500 od firmy StressTech je jeden z najroz\u0161\u00EDrenej\u0161\u00EDch pr\u00EDstrojov na meranie B\u0160 v priemyseln\u00FDch aplik\u00E1ci\u00E1ch. Probl\u00E9mom je, \u017Ee nameran\u00E9 priebehy z\u00EDskan\u00E9 t\u00FDmto pr\u00EDstrojom s\u00FA za\u0165a\u017Een\u00E9 r\u00F4znymi druhmi neu\u017Eito\u010Dn\u00FDch sign\u00E1lov, najm\u00E4 vibr\u00E1ci\u00ED, \u0161umov a systematick\u00FDch ch\u00FDb pr\u00EDstroja. Na\u0161\u00EDm pr\u00EDnosom je met\u00F3da spracovania B\u0160 zalo\u017Een\u00E1 na rozklade nameran\u00FDch priebehov na jednotliv\u00E9 zlo\u017Eky. Sk\u00FAman\u00EDm t\u00FDchto zlo\u017Eiek s\u00FA analyzovan\u00E9 vlastnosti samotn\u00E9ho pr\u00EDstroja. Na z\u00E1klade z\u00EDskan\u00FDch poznatkov je mo\u017En\u00E9 n\u00E1js\u0165 optimalizova\u0165 experiment\u00E1lne podmienky tak, aby boli v\u00FDsledky \u010Do najmenej za\u0165a\u017Een\u00E9 ne\u017Eiaducimi javmi. Numerick\u00E9 korekcie hardv\u00E9rov\u00FDch nedostatkov pr\u00EDstroja umo\u017E\u0148uj\u00FA jeho pou\u017Eitie aj pre vedeck\u00E9 \u00FA\u010Dely." . "Mi\u010Dica, Martin" . "RIV/61989100:27360/13:86087943" . "Barkhausen noise measurement ( BS) in engineering industry used as a quick , simple and reliable method for obtaining information on the properties of machined surfaces . Based on its size , it is possible to uncover hidden defects and thus allocate bad products during production . The Microscan Stresstech 500 device is one of the most widely used instruments for measuring a BS in industrial applications . The problem is that the measured waveforms obtained by this device are loaded with different kinds of useless signals, especially vibration, noise and systematic errors of the instrument. Our contribution is about the BS processing method based on the decomposition of measured data on the individual components . By examining these components the properties of the device are analysed. Based on these results it can be found to optimize the experimental conditions so that the results are the least affected by undesirable phenomena. The numerical corrections of the device hardware deficiencies allows its use for scientific purposes."@en . "1"^^ . "ANAL\u00DDZA VHODNOSTI PR\u00CDSTROJA STRESSTECH MICROSCAN 500 NA \u0160T\u00DADIUM BARKHAUSENOVHO \u0160UMU" . "Bla\u017Eek, Dalibor" . "ANAL\u00DDZA VHODNOSTI PR\u00CDSTROJA STRESSTECH MICROSCAN 500 NA \u0160T\u00DADIUM BARKHAUSENOVHO \u0160UMU" . "V" . "Durstov\u00E1, Zuzana" . . "61117" . . . "[4FE98A7C5B2F]" . "27360" . "RIV/61989100:27360/13:86087943!RIV14-MSM-27360___" . "4"^^ . . . . . . . . "The analysis of the fitness of the Stresstech Microscan 500 device to the study of Barkhausen noise"@en . . .