. . "Spectral polarimetry-based measurement of the thickness of a thin film" . . "Spectral polarimetry-based measurement of the thickness of a thin film"@en . . "8"^^ . "Bellingham" . . "P(ED0040/01/01), Z(MSM6198910016)" . "27360" . "RIV/61989100:27360/11:86078670" . "0277-786X" . "[EC6333C29F0F]" . "2011-05-23+02:00"^^ . "Spectral polarimetry-based measurement of the thickness of a thin film" . "Optical Measurement Systems for Industrial Inspection VII : 23-26 May 2011, Munich, Germany" . . "231371" . . . "RIV/61989100:27360/11:86078670!RIV12-MSM-27360___" . "978-0-8194-8678-3" . "Spectral polarimetry-based measurement of the thickness of a thin film"@en . "Lu\u0148\u00E1\u010Dek, Ji\u0159\u00ED" . . . "A simple polarimetry configuration is used for measuring the thickness of a nonabsorbing thin film on an absorbing substrate from the ratio between the spectral reflectances."@en . . . . . . "Ciprian, Dalibor" . . "Hlubina, Petr" . "SPIE" . . . . "Mnichov" . "3"^^ . "spectral polarimetry, reflectance ratio, thin film, thickness"@en . "000295076900098" . . . "3"^^ . . "A simple polarimetry configuration is used for measuring the thickness of a nonabsorbing thin film on an absorbing substrate from the ratio between the spectral reflectances." .