. "Spectral interferometry and reflectometry used for characterization of a multilayer mirror" . . "Lu\u0148\u00E1\u010Dek, Ji\u0159\u00ED" . . "Spectral interferometry and reflectometry used for characterization of a multilayer mirror"@en . "Ciprian, Dalibor" . . "Z(MSM6198910016)" . "Spectral interferometry and reflectometry used for characterization of a multilayer mirror"@en . . "Spectral interferometry and reflectometry used for characterization of a multilayer mirror" . "US - Spojen\u00E9 st\u00E1ty americk\u00E9" . "10" . "000267064500025" . "342880" . . "27350" . . . "34" . . "Optics Letters" . . "RIV/61989100:27350/09:00021681" . . "white-light interferometry; group delay; dispersion"@en . "0146-9592" . . . "A white-light spectral interferometric technique is used to retrieve a relative spectral phase and group delay of a multilayer mirror from the spectral interferograms recorded in a dispersive Michelson interferometer. The phase retrieval is based on the use of a windowed Fourier transform in the wavelength domain, and characterization of the multilayer mirror is completed by a three-step measurement of the reflectance spectrum of the mirror in the same interferometer." . . "RIV/61989100:27350/09:00021681!RIV10-MSM-27350___" . "3"^^ . "Hlubina, Petr" . . "3"^^ . "A white-light spectral interferometric technique is used to retrieve a relative spectral phase and group delay of a multilayer mirror from the spectral interferograms recorded in a dispersive Michelson interferometer. The phase retrieval is based on the use of a windowed Fourier transform in the wavelength domain, and characterization of the multilayer mirror is completed by a three-step measurement of the reflectance spectrum of the mirror in the same interferometer."@en . "[30C293D4F11C]" . "3"^^ . . .