. "1862-6300" . . "4"^^ . . "388699" . . "4" . . . . . . "A procedure for the measurement of the generalized ellipsometric angles using a phase-modulation spectroscopic ellipsometer is described. Generalized phase-modulation ellipsometry combined with zone averaging enables precise characterization of samples with generalized anisotropy including anisotropic thin films with general axis orientation, liquid crystals, gratings, and anisotropic nanostructures. We employed a UVISEL Jobin Yvon spectroscopic ellipsometer with a photoelastic modulator (PEM). The Jones matrix formalism is applied to nondepolarizing samples and ellipsometer components description. The zone averaging proposed enables elimination of azimuth-angle error and component imperfection." . "Precise phase-modulation generalized ellipsometry of anisotropic samples"@en . . "[569B3A8FD0ED]" . . "Precise phase-modulation generalized ellipsometry of anisotropic samples"@en . "27350" . "A procedure for the measurement of the generalized ellipsometric angles using a phase-modulation spectroscopic ellipsometer is described. Generalized phase-modulation ellipsometry combined with zone averaging enables precise characterization of samples with generalized anisotropy including anisotropic thin films with general axis orientation, liquid crystals, gratings, and anisotropic nanostructures. We employed a UVISEL Jobin Yvon spectroscopic ellipsometer with a photoelastic modulator (PEM). The Jones matrix formalism is applied to nondepolarizing samples and ellipsometer components description. The zone averaging proposed enables elimination of azimuth-angle error and component imperfection."@en . . "RIV/61989100:27350/08:00019795" . "4"^^ . "Precise phase-modulation generalized ellipsometry of anisotropic samples" . . "generalized ellipsometry; anisotropic samples"@en . . "P(GA202/06/0531), P(KAN400100653), Z(MSM6198910016)" . "Foldyna, M." . "Phys.Status Solidi A" . "Pi\u0161tora, Jarom\u00EDr" . "2"^^ . . "RIV/61989100:27350/08:00019795!RIV10-MSM-27350___" . "US - Spojen\u00E9 st\u00E1ty americk\u00E9" . . . "Precise phase-modulation generalized ellipsometry of anisotropic samples" . "Postava, Kamil" . "205" . "Halaga\u010Dka, L." . .