"Effect of the reflectance model on determination of the thin-film thickness"@en . . . . "Pr\u00E1ce prezentuje vliv pou\u017Eit\u00ED r\u016Fzn\u00FDch model\u016F odrazivosti syst\u00E9mu tenk\u00E1 vrstva - podlo\u017Eka na vypo\u010Dten\u00ED tlou\u0161\u0165ky tenk\u00E9 vrstvy. V prost\u0159ed\u00ED Matlabu je vytvo\u0159en program, kter\u00FD pomoc\u00ED obecn\u00E9ho modelu vypo\u010Dte teoretick\u00FD pr\u016Fb\u011Bh spektr\u00E1ln\u00ED odrazivosti v z\u00E1vislosti na vlnov\u00E9 d\u00E9lce pro zvolenou tlou\u0161\u0165ku tenk\u00E9 vrstvy. Takto vypo\u010Dten\u00E1 odrazivost, kter\u00E1 v dal\u0161\u00ED f\u00E1zi studia simuluje nam\u011B\u0159enou odrazivost, je zpracov\u00E1na dal\u0161\u00EDm programem v Matlabu, kter\u00FD simulovan\u00E9 (nam\u011B\u0159en\u00E9) reflexn\u00ED spektrum fituje spektrem teoretick\u00FDm, kde fitovan\u00FDm parametrem je tlou\u0161\u0165ka vrstvy. Ve vstupn\u00EDch souborech fitovan\u00E9ho teoretick\u00E9ho reflexn\u00EDho spektra jsou pou\u017Eity r\u016Fzn\u00E9 kombinace disperzn\u00EDch a nedisperzn\u00EDch optick\u00FDch parametr\u016F syst\u00E9mu tenk\u00E1 vrstva ? podlo\u017Eka a je sledov\u00E1n jejich vliv na hodnotu vypo\u010Dten\u00E9 tlou\u0161\u0165ky tenk\u00E9 vrstvy."@cs . . . "[6A6969AE77DE]" . . . . . "RIV/61989100:27350/08:00019681" . . "CZ - \u010Cesk\u00E1 republika" . "Effect of the reflectance model on determination of the thin-film thickness"@en . "3"^^ . . "Vliv pou\u017Eit\u00E9ho modelu odrazivosti na ur\u010Den\u00ED tlou\u0161\u0165ky tenk\u00E9 vrstvy"@cs . "Vliv pou\u017Eit\u00E9ho modelu odrazivosti na ur\u010Den\u00ED tlou\u0161\u0165ky tenk\u00E9 vrstvy" . "Lu\u0148\u00E1\u010Dkov\u00E1, Milena" . "Z(MSM6198910016)" . "This paper presents the effect of various reflectance models of the thin-film structure system on determination of the thin-film thickness. A special program was created in software package Matlab, which is able to calculate theoretical spectral reflectance in selected wavelength interval for the certain thin-film thickness. Afterwards, this reflectance, which simulates experimental reflectance during the following study, is processed by other program in Matlab. In this way the simulated reflectance is fitted to theoretical one with thin-film thickness as fitted parameter. Different combinations of optical parameters - dispersive and non-dispersive - for the thin-film structure system can be used as the input for the program files in the fitted reflection spectrum. Finally, the effect of reflectance models on the value of the thin-film thickness is discussed."@en . "0447-6441" . "403229" . . "4"^^ . "Ciprian, Dalibor" . "Hlubina, Petr" . "Lu\u0148\u00E1\u010Dek, Ji\u0159\u00ED" . . . "53" . "4"^^ . "27350" . . "Fresnel?s formulas; spectral reflectance; thin-film structure; dispersion"@en . "RIV/61989100:27350/08:00019681!RIV09-MSM-27350___" . . "Vliv pou\u017Eit\u00E9ho modelu odrazivosti na ur\u010Den\u00ED tlou\u0161\u0165ky tenk\u00E9 vrstvy"@cs . "Vliv pou\u017Eit\u00E9ho modelu odrazivosti na ur\u010Den\u00ED tlou\u0161\u0165ky tenk\u00E9 vrstvy" . . "Jemn\u00E1 mechanika a optika" . . "Pr\u00E1ce prezentuje vliv pou\u017Eit\u00ED r\u016Fzn\u00FDch model\u016F odrazivosti syst\u00E9mu tenk\u00E1 vrstva - podlo\u017Eka na vypo\u010Dten\u00ED tlou\u0161\u0165ky tenk\u00E9 vrstvy. V prost\u0159ed\u00ED Matlabu je vytvo\u0159en program, kter\u00FD pomoc\u00ED obecn\u00E9ho modelu vypo\u010Dte teoretick\u00FD pr\u016Fb\u011Bh spektr\u00E1ln\u00ED odrazivosti v z\u00E1vislosti na vlnov\u00E9 d\u00E9lce pro zvolenou tlou\u0161\u0165ku tenk\u00E9 vrstvy. Takto vypo\u010Dten\u00E1 odrazivost, kter\u00E1 v dal\u0161\u00ED f\u00E1zi studia simuluje nam\u011B\u0159enou odrazivost, je zpracov\u00E1na dal\u0161\u00EDm programem v Matlabu, kter\u00FD simulovan\u00E9 (nam\u011B\u0159en\u00E9) reflexn\u00ED spektrum fituje spektrem teoretick\u00FDm, kde fitovan\u00FDm parametrem je tlou\u0161\u0165ka vrstvy. Ve vstupn\u00EDch souborech fitovan\u00E9ho teoretick\u00E9ho reflexn\u00EDho spektra jsou pou\u017Eity r\u016Fzn\u00E9 kombinace disperzn\u00EDch a nedisperzn\u00EDch optick\u00FDch parametr\u016F syst\u00E9mu tenk\u00E1 vrstva ? podlo\u017Eka a je sledov\u00E1n jejich vliv na hodnotu vypo\u010Dten\u00E9 tlou\u0161\u0165ky tenk\u00E9 vrstvy." . . "11-12" .