"Thickness of SiO2 thin film on silicon wafer measured by dispersive white-light spectral interferometry" . "http://www.isvav.cz/h11/resultDetail.do?rowId=RIV%2F61989100%3A27350%2F06%3A00016807!RIV08-GA0-27350___"^^ . "ZbAqamRsVP8hNEqj6eGc65vYyv4=" . "APPLIED PHYSICS B-LASERS AND OPTICS" . . . . "RIV/61989100:27350/06:00016807!RIV08-GA0-27350___" . . . . . "77.784"^^ . "1"^^ . . "Metodika hodnocen\u00ED, v\u00FDsledek hodnocen\u00FD ji\u017E v p\u0159edchoz\u00EDm hodnocen\u00ED, body se p\u0159eb\u00EDraj\u00ED." . "77.784"^^ . . . .