. "Capillary discharge; EUV; laser; focusing; surface; modification; plasma; ablation"@en . . "\u0160traus, Jaroslav" . "Frolov, Oleksandr" . "RIV/61389021:_____/12:00386547!RIV13-AV0-61389021" . "Non-thermal surface modification of solids induced by EUV laser pulses(ICOPS\u20192012, 1P-166)"@en . . . . . . . "P\u0159edneseno na konf.:Plasma Science(ICOPS), 2012 Abstracts IEEE International Conference on,Edinburgh,GB,08.07.2012-13.07.2012, We report results of experiments connected with surface modi\uFB01cation of organic and inorganic materials with an intense EUV laser beam. The samples were irradiated by laser beam from a discharge-plasma EUV source (with wavelength 46.9 nm) based on a high-current capillary discharge driver. A detailed description of our driver CAPEX can be found in the early published paper [1]. The laser beam is focused with a spherical (R=2100 mm) Si/Sc multilayer-coated mirror on polymethylmethacrylate (PMMA), gold-covered-PMMA and gallium arsenide (GaAs) samples. For analysis of laser beam footprints an atomic-force microscope (AFM) was used. It turned out that the energy of focused EUV laser beam is sufficient for ablation not only easily ablative material PMMA but also thin layer of gold (thickness 40 nm) and GaAs by single shot, even if the focus is significantly"@en . "Non-thermal surface modification of solids induced by EUV laser pulses(ICOPS\u20192012, 1P-166)" . . . . . . "RIV/61389021:_____/12:00386547" . "Non-thermal surface modification of solids induced by EUV laser pulses(ICOPS\u20192012, 1P-166)"@en . . "Kol\u00E1\u010Dek, Karel" . . . "Non-thermal surface modification of solids induced by EUV laser pulses(ICOPS\u20192012, 1P-166)" . . . . "154444" . "[42E3E72A5993]" . "P(LA08024), Z(AV0Z20430508)" . . . "P\u0159edneseno na konf.:Plasma Science(ICOPS), 2012 Abstracts IEEE International Conference on,Edinburgh,GB,08.07.2012-13.07.2012, We report results of experiments connected with surface modi\uFB01cation of organic and inorganic materials with an intense EUV laser beam. The samples were irradiated by laser beam from a discharge-plasma EUV source (with wavelength 46.9 nm) based on a high-current capillary discharge driver. A detailed description of our driver CAPEX can be found in the early published paper [1]. The laser beam is focused with a spherical (R=2100 mm) Si/Sc multilayer-coated mirror on polymethylmethacrylate (PMMA), gold-covered-PMMA and gallium arsenide (GaAs) samples. For analysis of laser beam footprints an atomic-force microscope (AFM) was used. It turned out that the energy of focused EUV laser beam is sufficient for ablation not only easily ablative material PMMA but also thin layer of gold (thickness 40 nm) and GaAs by single shot, even if the focus is significantly" . "Frolov, Oleksandr" . "Schmidt, Ji\u0159\u00ED" . "6"^^ . "Prukner, V\u00E1clav" . "Choukourov, A." . . . . . . "5"^^ .