"flash memory; accelerated test; electronic item"@en . . "Vali\u0161, David" . "Accelerated test as a tool for reliability comparison of systems manufactured by different ways" . "RIV/60162694:G43__/11:00436939!RIV12-MO0-G43_____" . . . "http://vavtest.unob.cz/registr" . "New York" . . "IEEE" . "Accelerated test as a tool for reliability comparison of systems manufactured by different ways"@en . . . "Accelerated test as a tool for reliability comparison of systems manufactured by different ways" . "184376" . "The Proceedings of 2011 9th International Conference on Reliability, Maintainability, and Safety" . "G43" . . . "RIV/60162694:G43__/11:00436939" . . "The paper deals with a highly reliable electronic item containing a flash memory that is programmed during the manufacturing process. Non-intentional causes resulted in non-compliance of programming process with the prescribed manufacturing process. It was also decided to check influence of the manufacturing error using an accelerated test. The article describes the test methodology, practical realisation of the test and evaluation of test results."@en . "5"^^ . "Accelerated test as a tool for reliability comparison of systems manufactured by different ways"@en . . . . "The paper deals with a highly reliable electronic item containing a flash memory that is programmed during the manufacturing process. Non-intentional causes resulted in non-compliance of programming process with the prescribed manufacturing process. It was also decided to check influence of the manufacturing error using an accelerated test. The article describes the test methodology, practical realisation of the test and evaluation of test results." . . "[77551A76AA9F]" . "Guiyang, China" . . "I" . "2011-01-01+01:00"^^ . "Vintr, Zden\u011Bk" . "2"^^ . . . "2"^^ . "978-1-61284-664-4" .