. "The European Conference on Circuit Theory and Design (ECCTD)." . . "Nonlinear On-Chip Capacitor Characterization" . "IEEE" . . . . "http://vavtest.unob.cz/registr" . "Sutor\u00FD, Tom\u00E1\u0161" . . . . "000258708400056" . "2007-01-01+01:00"^^ . "Biolkov\u00E1, Viera" . "Characterization; chip; SWITCHED CAPACITOR"@en . "RIV/60162694:G43__/07:00398636!RIV13-MO0-G43_____" . "Nonlinear On-Chip Capacitor Characterization"@en . . . "RIV/60162694:G43__/07:00398636" . "The paper deals with a modification of the CBCM method for nonlinear on-chip capacitance characterization. The proposed modification uses two DC swept sources to measure the whole nonlinear Q-v characteristic in both polarities without the necessity to switch the object being measured. A test-chip implementing the method was designed and manufactured in the 0.35\u03BCm CMOS process. It was used for MOSCAP characterization in the full operating voltage range."@en . . "Biolek, Dalibor" . "Sevilla, Spain" . "Nonlinear On-Chip Capacitor Characterization" . . "Sevilla, Spain" . "437523" . . "The paper deals with a modification of the CBCM method for nonlinear on-chip capacitance characterization. The proposed modification uses two DC swept sources to measure the whole nonlinear Q-v characteristic in both polarities without the necessity to switch the object being measured. A test-chip implementing the method was designed and manufactured in the 0.35\u03BCm CMOS process. It was used for MOSCAP characterization in the full operating voltage range." . "4"^^ . . "4"^^ . "1"^^ . "G43" . . "978-1-4244-1341-6" . "Kolka, Zden\u011Bk" . "Z(MO0FVT0000403)" . "[C4F6E2763B27]" . . "Nonlinear On-Chip Capacitor Characterization"@en .