"Netrvalov\u00E1, Marie" . "[4C12677F3F6E]" . . "Optical properties of re-crystallized polycrystalline silicon thin films from a-Si films deposited by electron beam evaporation"@en . "331827" . . . "23640" . "5" . "Optical properties of re-crystallized polycrystalline silicon thin films from a-Si films deposited by electron beam evaporation" . . "1335-3632" . "Optical properties of re-crystallized polycrystalline silicon thin films from a-Si films deposited by electron beam evaporation"@en . . "This paper deals with the structural and optical properties of the polycrystalline silicon films initially deposited in amorphous state by electron beam evaporation technology on a Corning glass and consequently thermally re-crystallized from solid phase. The re-crystallization process was ?in situ? monitored by X-ray diffraction using an evacuated high temperature chamber at temperatures from 590\u00B0C to 650\u00B0C. Optical properties of the films carried out from the optical spectrophotometry recorded in a visible range of electromagnetic spectra were then confronted with the micro-structure parameters of the films. Relationships between the crystalline/amorphous state, crystallite size and optical band-gaps, spectral refractive indexes and spectral extinction coefficients are clearly demonstrated." . "Optical properties of re-crystallized polycrystalline silicon thin films from a-Si films deposited by electron beam evaporation" . "\u0160utta, Pavol" . "RIV/49777513:23640/09:00501778" . "Journal of Electrical Engineering" . . "000271846100008" . "SK - Slovensk\u00E1 republika" . . "Vavru\u0148kov\u00E1, Veronika" . . . "optical properties; a-Si thin films; annealing"@en . "RIV/49777513:23640/09:00501778!RIV10-MSM-23640___" . "4"^^ . "4"^^ . . "P(1M06031)" . . "60" . . . . "2"^^ . . "This paper deals with the structural and optical properties of the polycrystalline silicon films initially deposited in amorphous state by electron beam evaporation technology on a Corning glass and consequently thermally re-crystallized from solid phase. The re-crystallization process was ?in situ? monitored by X-ray diffraction using an evacuated high temperature chamber at temperatures from 590\u00B0C to 650\u00B0C. Optical properties of the films carried out from the optical spectrophotometry recorded in a visible range of electromagnetic spectra were then confronted with the micro-structure parameters of the films. Relationships between the crystalline/amorphous state, crystallite size and optical band-gaps, spectral refractive indexes and spectral extinction coefficients are clearly demonstrated."@en . "M\u00FCllerov\u00E1, Jarmila" . .