"Metodika na m\u011B\u0159en\u00ED rezistivity tenk\u00FDch vrstev \u010Dty\u0159-bodovou metodou" . "Pracovi\u0161t\u011B na m\u011B\u0159en\u00ED n\u00EDzk\u00FDch rezistivit polovodi\u010D\u016F \u010Dty\u0159-bodovou metodou s line\u00E1rn\u00EDm a kvadratick\u00FDm hrotem je zapojeno na po\u010D\u00EDta\u010D se sb\u011Brem a zpracov\u00E1n\u00EDm dat a programem na ovl\u00E1d\u00E1n\u00ED m\u011B\u0159en\u00ED. Na pracovi\u0161ti lze m\u011B\u0159it jak velk\u00E9, tak mal\u00E9 rozm\u011Bry vzork\u016F, objemov\u00E9 i tenk\u00E9 vrstvy zad\u00E1n\u00EDm vypo\u010Dten\u00FDch korek\u010Dn\u00EDch faktor\u016F na velikost a tvar vzorku."@cs . . . . . "Equipment for measurement of low resistivity using four-probe method with linear and quadratic electrode tips order is connected to computer making possible a data collection and data acquisition and software for measurement control. The equipment makes possible to measure small as well as large samples, bulk samples and thin films giving calculated correction factor taking into account dimension and shape of the samples."@en . "1"^^ . "The method for measurement of resistivity of thin films by a four-probe method."@en . "Metodika na m\u011B\u0159en\u00ED rezistivity tenk\u00FDch vrstev \u010Dty\u0159-bodovou metodou"@cs . . "Metodika na m\u011B\u0159en\u00ED rezistivity tenk\u00FDch vrstev \u010Dty\u0159-bodovou metodou"@cs . . "The method for measurement of resistivity of thin films by a four-probe method."@en . "\u0160utta, Pavol" . "1"^^ . "Mo\u017Enost rychl\u00E9ho a p\u0159esn\u00E9ho m\u011B\u0159en\u00ED rezistivity tenk\u00FDch vrstev." . "NTC-MT-03-07" . "RIV/49777513:23640/07:00000002!RIV08-MSM-23640___" . . . . . "P(1M06031)" . . "\u0160utta, Pavol" . . . . . "23640" . . "electric resistivity; four-probe method; semiconductor"@en . "M\u011B\u0159en\u00ED rezistivity mal\u00FDch vzork\u016F (a\u017E do velikosti 4x4 mm), mo\u017Enost pou\u017Eit\u00ED line\u00E1rn\u00ED nebo kvadratick\u00E9 m\u011B\u0159\u00EDc\u00ED hlavy podle tvaru a velikosti vzorku." . "RIV/49777513:23640/07:00000002" . "SOLARTEC s.r.o." . "[911532320F4A]" . . . "Pracovi\u0161t\u011B na m\u011B\u0159en\u00ED n\u00EDzk\u00FDch rezistivit polovodi\u010D\u016F \u010Dty\u0159-bodovou metodou s line\u00E1rn\u00EDm a kvadratick\u00FDm hrotem je zapojeno na po\u010D\u00EDta\u010D se sb\u011Brem a zpracov\u00E1n\u00EDm dat a programem na ovl\u00E1d\u00E1n\u00ED m\u011B\u0159en\u00ED. Na pracovi\u0161ti lze m\u011B\u0159it jak velk\u00E9, tak mal\u00E9 rozm\u011Bry vzork\u016F, objemov\u00E9 i tenk\u00E9 vrstvy zad\u00E1n\u00EDm vypo\u010Dten\u00FDch korek\u010Dn\u00EDch faktor\u016F na velikost a tvar vzorku." . "433302" . "Metodika na m\u011B\u0159en\u00ED rezistivity tenk\u00FDch vrstev \u010Dty\u0159-bodovou metodou" .