. "Neuveden" . "1"^^ . "0"^^ . "1"^^ . "0"^^ . . "This paper describes application of statistical analysis to process analytical results. It is shown how contamination of material can be found, even when its homogeneity is low. It is another problem than trace analysis, because the bias content of cont aminating element is relatively high."@en . "statistical analysis; chemistry; XRF spectroscopy"@en . "598928" . . "1"^^ . . . "Application of statistical analysis to find product contamination" . "Ustro\u0148" . "Application of statistical analysis to find product contamination"@en . . "P(LN00B084)" . "XXV Konferencja analityki hutniczej" . . "RIV/49777513:23640/03:00000169!RIV/2004/MSM/236404/N" . . . . "Application of statistical analysis to find product contamination" . "[FD32B11646F2]" . "Application of statistical analysis to find product contamination" . "Mu\u017E\u00EDk, Tom\u00E1\u0161" . "Application of statistical analysis to find product contamination"@en . . . "RIV/49777513:23640/03:00000169" . . . "1"^^ . . "This paper describes application of statistical analysis to process analytical results. It is shown how contamination of material can be found, even when its homogeneity is low. It is another problem than trace analysis, because the bias content of cont aminating element is relatively high." . "23640" .