. . "Knobloch, H." . . "P(LN00B084)" . "CIGR\u00C9" . . . "[6161D1885484]" . "RIV/49777513:23640/02:00073645!RIV/2003/MSM/236403/N" . "Sedl\u00E1\u010Dek, Jan" . . "5"^^ . "Double and single-break vacuum interrupters for high voltage application- experiences on real high-voltage demonstration-tubes-"@en . . . . "Double and single-break vacuum interrupters for high voltage application- experiences on real high-voltage demonstration-tubes-" . . "Double and single-break vacuum interrupters for high voltage application- experiences on real high-voltage demonstration-tubes-"@en . . . . . "RIV/49777513:23640/02:00073645" . "23640" . "vacuum circuit breaker;dielectric endurance;voltage;switching"@en . "Giere, S." . . "Double and single-break vacuum interrupters for high voltage application- experiences on real high-voltage demonstration-tubes-" . "Double and single-break vacuum interrupters for high voltage application- experiences on real high-voltage demonstration-tubes-" . "1"^^ . . "The paper describes switching and dielectric experiments with vacuum demonstration tubes for the 84 kV voltage level. The investigations were performed with two different tube designs. The difference between these objects is the number of breaker units per tube and slight deviations in the shielding arrangement. The tubes were tested under different switching conditions, especially terminal fault, short-line fault, capacitive and inductive current switching. The switching results of double and single-break units were discussed. In addition to the pure switching experiments, the dielectric strength after these tests was determined." . . "3"^^ . "2002-01-01+01:00"^^ . "0"^^ . "Paris" . "The paper describes switching and dielectric experiments with vacuum demonstration tubes for the 84 kV voltage level. The investigations were performed with two different tube designs. The difference between these objects is the number of breaker units per tube and slight deviations in the shielding arrangement. The tubes were tested under different switching conditions, especially terminal fault, short-line fault, capacitive and inductive current switching. The switching results of double and single-break units were discussed. In addition to the pure switching experiments, the dielectric strength after these tests was determined."@en . "0"^^ . "Paris" . "643647" . "1" .