"[4307C8C0D7F5]" . "23210" . "Analysis of mechanical properties of thin films systems from from dependence of kind of information and value of loading"@en . . . . "2002-01-01+01:00"^^ . "Hodnocen\u00ED mechanick\u00FDch vlastnost\u00ED tenkovrstv\u00FDch syst\u00E9m\u016F z grafu z\u00E1vislosti m\u00EDry informace na zat\u00ED\u017Een\u00ED" . "The paper is devoted with analysis of mechanical properties of systems thin film - substrate in wide range of value of loading. From the graph of dependence of kind of information and value of loading is possible to analyse complex mechanical properties."@en . . . "Hodnocen\u00ED mechanick\u00FDch vlastnost\u00ED tenkovrstv\u00FDch syst\u00E9m\u016F z grafu z\u00E1vislosti m\u00EDry informace na zat\u00ED\u017Een\u00ED" . . "indentation tests;nanohardness;microhardness;hardness;mechanical properties;thin films"@en . "Hodnocen\u00ED mechanick\u00FDch vlastnost\u00ED tenkovrstv\u00FDch syst\u00E9m\u016F z grafu z\u00E1vislosti m\u00EDry informace na zat\u00ED\u017Een\u00ED"@cs . . . "P\u0159\u00EDsp\u011Bvek se zab\u00FDv\u00E1 hodnocen\u00EDm vlivu vzd\u00E1lenosti hranice zrna od vtisku v mikrostruktu\u0159e substr\u00E1tu na m\u011B\u0159en\u00ED mechanick\u00FDch vlastnost\u00ED a chov\u00E1n\u00ED v r\u016Fzn\u00FDch strukturn\u00EDch slo\u017Ek\u00E1ch a to i v z\u00E1vislosti na velikosti zat\u00ED\u017Een\u00ED p\u016Fsob\u00EDc\u00EDho na diamantov\u00FD hrot." . . "N\u011Bmec, Radek" . . "RIV/49777513:23210/02:00072618" . "\u0160t\u011Bp\u00E1nek, Ivo" . . . "Neuveden" . . "0"^^ . "Neuveden" . "2"^^ . "0"^^ . "Neuveden" . . "647793" . "Hodnocen\u00ED mechanick\u00FDch vlastnost\u00ED tenkovrstv\u00FDch syst\u00E9m\u016F z grafu z\u00E1vislosti m\u00EDry informace na zat\u00ED\u017Een\u00ED" . "1"^^ . . "Hodnocen\u00ED mechanick\u00FDch vlastnost\u00ED tenkovrstv\u00FDch syst\u00E9m\u016F z grafu z\u00E1vislosti m\u00EDry informace na zat\u00ED\u017Een\u00ED"@cs . "RIV/49777513:23210/02:00072618!RIV/2003/MSM/232103/N" . . . "2"^^ . "Analysis of mechanical properties of thin films systems from from dependence of kind of information and value of loading"@en . "Z(MSM 232100006)" . "0" . . . .