"The reliability issue, including aging processes in modern devices with very fine structures and utilizing programmable technologies, being applied in high-performance or dependable systems in various safety, automotive or space applications, is sometimes very difficult to predict, measure or watch. The task is well-mastered in the world of ASIC, the situation is slightly different for FPGA devices. Modern FPGA devices incorporate number of true dual-port memory blocks with 8-T cells, hence offering new options. However, such blocks are typically used for data storage and processing purposes. This paper presents a new way of utilization of the RAM block (BRAM) for the delay fault detection purposes. The BRAM and a simple controller log risky transitions or delay fault events and may positively affect the overall reliability of the device as well as all the system." . "129962" . . "4"^^ . "Proceedings of the Biennial Baltic Electronics Conference, BEC" . "The reliability issue, including aging processes in modern devices with very fine structures and utilizing programmable technologies, being applied in high-performance or dependable systems in various safety, automotive or space applications, is sometimes very difficult to predict, measure or watch. The task is well-mastered in the world of ASIC, the situation is slightly different for FPGA devices. Modern FPGA devices incorporate number of true dual-port memory blocks with 8-T cells, hence offering new options. However, such blocks are typically used for data storage and processing purposes. This paper presents a new way of utilization of the RAM block (BRAM) for the delay fault detection purposes. The BRAM and a simple controller log risky transitions or delay fault events and may positively affect the overall reliability of the device as well as all the system."@en . . "2012-10-03+02:00"^^ . "Delay-fault run-time XOR-less aging detection unit using BRAM in modern FPGAs" . . . "Tallinn" . . . "RIV/46747885:24220/12:#0002014" . "Delay-fault run-time XOR-less aging detection unit using BRAM in modern FPGAs"@en . "24220" . "Delay-fault run-time XOR-less aging detection unit using BRAM in modern FPGAs"@en . "S" . . . . "978-1-4673-2775-6" . "[11FC5A4AD634]" . "2"^^ . . . "1736-3705" . "Neuveden" . . "10.1109/BEC.2012.6376820" . . . "Pfeifer, Petr" . "RIV/46747885:24220/12:#0002014!RIV13-MSM-24220___" . "2"^^ . "Pl\u00EDva, Zden\u011Bk" . "Delay fault"@en . "Delay-fault run-time XOR-less aging detection unit using BRAM in modern FPGAs" . "http://www.scopus.com" . .