. . . . "Tagantsev, Alexander K." . "IMF-ISAF-2009" . . . "RIV/46747885:24220/09:#0001261" . "RIV/46747885:24220/09:#0001261!RIV10-GA0-24220___" . . . "1"^^ . . "Advanced characterization techniques for ferroelectric ceramics and films play an essential role in successful applications of ferroelectric materials in devices. It is known that the presence of crystal lattice defects or electrode-adjacent non-ferroelectric (dead) layers badly deteriorate the dielectric properties of ferroelectric thin films. We propose a characterization technique for ferroelectric polydomain films, which is based on the analysis of the higher-order harmonics in the small-signal dielectric response of the film. Such information can then be used as a feedback for modifying the thin film processing and for tailoring their dielectric properties. Numerical estimates relevant to PZT films are provided."@en . . . "Alternative Characterization Tool for Ferroelectric Polydomain Films"@en . . "2"^^ . . "302545" . . . "Advanced characterization techniques for ferroelectric ceramics and films play an essential role in successful applications of ferroelectric materials in devices. It is known that the presence of crystal lattice defects or electrode-adjacent non-ferroelectric (dead) layers badly deteriorate the dielectric properties of ferroelectric thin films. We propose a characterization technique for ferroelectric polydomain films, which is based on the analysis of the higher-order harmonics in the small-signal dielectric response of the film. Such information can then be used as a feedback for modifying the thin film processing and for tailoring their dielectric properties. Numerical estimates relevant to PZT films are provided." . "Alternative Characterization Tool for Ferroelectric Polydomain Films" . . "Alternative Characterization Tool for Ferroelectric Polydomain Films"@en . . "3" . "Mokr\u00FD, Pavel" . "P(GA101/08/1279), P(GA202/07/1289)" . "Xian, People's Republic of China" . "Alternative Characterization Tool for Ferroelectric Polydomain Films" . "Electronic Materials Research Laboratory of Xi\u2019an Jiaotong University, Xi'an 710049, People's Republic of China" . "Ferroelectric thin film; Dielectric aging; Dielectric characterization; Ferroelectric domains; Crystal lattice defects"@en . "24220" . "[DC54C6818AF8]" . . .