. "P(1QS108040510)" . . "Test Pattern Overlapping - a Promising Compression Method for Narrow Test Access Mechanism SOC Circuits"@en . "Nov\u00E1k, O." . "Test Pattern Compression"@en . . "Test Pattern Overlapping - a Promising Compression Method for Narrow Test Access Mechanism SOC Circuits" . . . "399654" . "Jen\u00ED\u010Dek, J." . "[86268F22F70C]" . "P\u0159ekr\u00FDv\u00E1n\u00ED testovac\u00EDch vzork\u016F - Slibn\u00E1 kompresn\u00ED metoda pro \u00FAzk\u00FD mechanismus testovac\u00EDho p\u0159\u00EDstupu obvodu na \u010Dipu"@cs . "\u010Cl\u00E1nek se zab\u00FDv\u00E1 testov\u00E1n\u00EDm pomoc\u00ED p\u0159ekr\u00FDv\u00E1n\u00ED vzork\u016F."@cs . "1" . "RIV/46747885:24220/08:#0001187!RIV09-AV0-24220___" . "The paper is about Test Pattern Overlapping."@en . . "2008" . . "2"^^ . "Test Pattern Overlapping - a Promising Compression Method for Narrow Test Access Mechanism SOC Circuits" . . "The paper is about Test Pattern Overlapping." . "2"^^ . . "1563-0064" . . . . "RIV/46747885:24220/08:#0001187" . . "Test Pattern Overlapping - a Promising Compression Method for Narrow Test Access Mechanism SOC Circuits"@en . "P\u0159ekr\u00FDv\u00E1n\u00ED testovac\u00EDch vzork\u016F - Slibn\u00E1 kompresn\u00ED metoda pro \u00FAzk\u00FD mechanismus testovac\u00EDho p\u0159\u00EDstupu obvodu na \u010Dipu"@cs . "Radioelectronics & Informatics" . "UA - Ukrajina" . "24220" . . "8"^^ .