"1"^^ . . . "Diagnostika SoC obvod\u016F vyu\u017E\u00EDvaj\u00EDc\u00ED RESPIN architekturu"@cs . "System-on-a-Chip Diagnostics Using RESPIN Architecture" . "RIV/46747885:24220/05:00000138" . . . . . "SoC diagnostics is based on the proposed IEEE 1500 standard and allows testing of cores in the system-on-a-chip by compressed test patterns. The RESPIN architecture decompresses the test patterns of a core with using other idle cores in the SoC." . . "System-on-a-Chip Diagnostics Using RESPIN Architecture" . . "[FB4F10982494]" . "Budapest, Hungary" . . . . "RIV/46747885:24220/05:00000138!RIV06-GA0-24220___" . "EDCC-5" . "System-on-a-Chip Diagnostics Using RESPIN Architecture"@en . "SoC diagnostics is based on the proposed IEEE 1500 standard and allows testing of cores in the system-on-a-chip by compressed test patterns. The RESPIN architecture decompresses the test patterns of a core with using other idle cores in the SoC."@en . . "Diagnostika syst\u00E9mu na \u010Dipu je zalo\u017Eena na navr\u017Een\u00E9m standardu IEEE 1500 a dovoluje testov\u00E1ni jader v obvodech SoC kompresn\u00EDm testovac\u00EDm vzorkem. RESPIN architektura testovac\u00ED vzorek dekomprimuje a k dekomprimaci vyu\u017E\u00EDv\u00E1 jin\u00FDch jader SoC obvodu."@cs . "Mader, Zbyn\u011Bk" . . "24220" . "System-on-a-Chip Diagnostics Using RESPIN Architecture"@en . . "1"^^ . . "Design for Test; core test; RESPIN; System on a Chip; Test Access Mechanism"@en . . "Diagnostika SoC obvod\u016F vyu\u017E\u00EDvaj\u00EDc\u00ED RESPIN architekturu"@cs . "545903" . . . "P(GA102/04/2137)" .