. "861-865" . . . "Test_Access block - Serial Scan vs. Random Access Scan" . . "[C9DFD5B0A548]" . "RIV/46747885:24220/05:00000122" . . "Neuveden" . . . "Obvod Test_access - srovn\u00E1n\u00ED s\u00E9riov\u00E9ho a paraleln\u00EDho rozhran\u00ED"@cs . "Grodner, M." . "Krakow, Poland" . "2"^^ . "Krakow, Poland" . "2005-01-01+01:00"^^ . . "Obvod Test_access - srovn\u00E1n\u00ED s\u00E9riov\u00E9ho a paraleln\u00EDho rozhran\u00ED"@cs . . . "83-919289-9-3" . "Proceedings of MIXDES2005" . . "4"^^ . "A part of EduChip Test Access Block (TA block) is presented in this paper. This chip was developed to demonstrate the Boundary Scan and Random Access Scan, controlled by separated TAP controllers.This paper is focused particularly on the layout design and on the measured results." . "Nov\u00E1k, Ond\u0159ej" . "RIV/46747885:24220/05:00000122!RIV06-GA0-24220___" . "P(GA102/04/2137)" . . "Test_Access block - Serial Scan vs. Random Access Scan"@en . "Test_Access block - Serial Scan vs. Random Access Scan" . "Digital ICs Testing, Boundary Scan, Random Access Scan, Educational Chips"@en . "546465" . "Pl\u00EDva, Zden\u011Bk" . "Test_Access block - Serial Scan vs. Random Access Scan"@en . "A part of EduChip Test Access Block (TA block) is presented in this paper. This chip was developed to demonstrate the Boundary Scan and Random Access Scan, controlled by separated TAP controllers.This paper is focused particularly on the layout design and on the measured results."@en . "24220" . "Prezentov\u00E1na je jedna \u010D\u00E1st EduChipu jm\u00E9nem Test Access Block (TA block). Tento obvod byl vyvinut pro srovn\u00E1n\u00ED vlastnost\u00ED dvou r\u016Fzn\u00FDch diagnostick\u00FDch metod - Boundary Scan (BS) a Random Access Scan (RAS).Tento p\u0159\u00EDsp\u011Bvek je zam\u011B\u0159en p\u0159edev\u0161\u00EDm na praktickourealizaci n\u00E1vrhu a na v\u00FDsledky m\u011B\u0159en\u00ED."@cs . . . . "5"^^ . . "Siekierska, K." . . .