"Neuveden" . . "Pl\u00EDva, Zden\u011Bk" . "Test Access Circuit for Education"@en . "24220" . "TestAccess - obvod pro v\u00FDuku"@cs . . . . "Siekierska, K." . "Grodner, M." . . . "963-9364-48-7" . "In this paper our educational chip is presented. In order to demonstrate both diagnostic access method properties we have proposed a simple functional block equipped both with a ScanChain and RAS access, controlled by the TAP controllers.We would like topresent the basic chip features in this paper." . "P\u0159\u00EDsp\u011Bvek popisuje n\u00E1mi vyvinut\u00FD v\u00FDukov\u00FD obvod, kter\u00FD je navr\u017Een pro ov\u011B\u0159ov\u00E1n\u00ED vlastnost\u00ED odli\u0161n\u00FDch diagnostick\u00FDch metod - ScanChain a RAS. Ob\u011B \u010D\u00E1sti jsou implementov\u00E1ny na jednoduch\u00FD obvod, pou\u017Eito je rozhran\u00ED BoundaryScan.P\u0159\u00EDsp\u011Bvek je zam\u011B\u0159en na popisz\u00E1kladn\u00ED princip\u016F a blok\u016F."@cs . "RIV/46747885:24220/05:00000121" . . "546453" . . . . . "Test Access Circuit for Education"@en . "In this paper our educational chip is presented. In order to demonstrate both diagnostic access method properties we have proposed a simple functional block equipped both with a ScanChain and RAS access, controlled by the TAP controllers.We would like topresent the basic chip features in this paper."@en . "Proceedings of DDECS2005" . . "Digital ICs Testing; Boundary Scan; Random Access Scan; Educational Chips"@en . "27-32" . . "2005-01-01+01:00"^^ . . "2"^^ . "Test Access Circuit for Education" . "6"^^ . "4"^^ . . "[0927D34A8B87]" . "Sopron, Hungary" . . "Sopron, Hungary" . . "P(GA102/04/2137)" . "Test Access Circuit for Education" . "RIV/46747885:24220/05:00000121!RIV06-GA0-24220___" . . "Nov\u00E1k, Ond\u0159ej" . "TestAccess - obvod pro v\u00FDuku"@cs .