"[D63CA76F58BD]" . . . . . "Neuveden" . "Metoda testov\u00E1ni SoC obvod\u016F je zalo\u017Eena na vznikaj\u00EDc\u00ED norm\u011B IEEE P1500 a umo\u017En\u00ED testovat j\u00E1dra v obvodech komprimovan\u00FDmi testovac\u00EDmi vektory s pou\u017Eit\u00EDm RESPIN architektury.Prototyp RESPIN architektury a \u0159\u00EDzeni testov\u00E1n\u00ED byl zrealizov\u00E1n na obvodu FPSLIC AT94K od firmy Atmel."@cs . "5"^^ . . . "66-71" . "Metoda testov\u00E1ni SoC obvod\u016F je zalo\u017Eena na vznikaj\u00EDc\u00ED norm\u011B IEEE P1500 a umo\u017En\u00ED testovat j\u00E1dra v obvodech komprimovan\u00FDmi testovac\u00EDmi vektory s pou\u017Eit\u00EDm RESPIN architektury.Prototyp RESPIN architektury a \u0159\u00EDzeni testov\u00E1n\u00ED byl zrealizov\u00E1n na obvodu FPSLIC AT94K od firmy Atmel." . "The test method is based on the proposed IEEE P1500 standard and allows testing of cores in the system-on-a-chip using RESPIN architecture by compressed test patterns.The prototype of RESPIN architecture and test control was realized on the circuit FPSLIC AT94K from Atmel."@en . . "Diagnostika SoC obvod\u016F s vyu\u017Eit\u00EDm RESPIN architektury"@cs . . . "Mader, Zbyn\u011Bk" . "80-969202-0-0" . . "Diagnostika SoC obvod\u016F s vyu\u017Eit\u00EDm RESPIN architektury" . "Diagnostika SoC obvod\u016F s vyu\u017Eit\u00EDm RESPIN architektury"@cs . "1"^^ . "2004-01-01+01:00"^^ . . "%22system-on-a-Chip;RESPIN;embedded test%22"@en . "1"^^ . "Diagnostika SoC obvod\u016F s vyu\u017Eit\u00EDm RESPIN architektury" . "Semin\u00E1\u0159 PAD" . "P(GA102/04/2137)" . . . . "System-on-a-Chip Diagnostics Using RESPIN Architecture"@en . "Moravany nad V\u00E1hom, Slovak Republic" . "560383" . "24220" . "RIV/46747885:24220/04:00000119!RIV/2005/GA0/242205/N" . "System-on-a-Chip Diagnostics Using RESPIN Architecture"@en . "Moravany nad V\u00E1hom, Slovak Republic" . . "RIV/46747885:24220/04:00000119" . .