. "P(GA102/04/2137)" . . "Test Set Compaction and Compression for circuits with Scan" . . "Neuveden" . . "Ajacio Corsica, France" . "Kompakce a komprese testovac\u00EDch vzork\u016F pro obvody s diagnostick\u00FDm p\u0159\u00EDstupem"@cs . "Ajacio Corsica, France" . "Holubec, Miroslav" . "Vytvo\u0159en\u00ED algoritmu komprese testovac\u00EDch vektor\u016F."@cs . "Test Set Compaction and Compression for circuits with Scan" . "The paper presents a new test pattern compression method." . "Jen\u00ED\u010Dek, Ji\u0159\u00ED" . . . . "Nov\u00E1k, Ond\u0159ej" . "%22built-in diagnostic aids;chip diagnostics%22"@en . "RIV/46747885:24220/04:00000117" . "[CF0277D2BA85]" . . . "590009" . "4"^^ . . "Informal Digest of Papers of the IEEE European Test Symposium" . . . "13-14" . . "Zahr\u00E1dka, Ji\u0159\u00ED" . "Test Set Compaction and Compression for circuits with Scan"@en . "Kompakce a komprese testovac\u00EDch vzork\u016F pro obvody s diagnostick\u00FDm p\u0159\u00EDstupem"@cs . "The paper presents a new test pattern compression method."@en . "4"^^ . "RIV/46747885:24220/04:00000117!RIV/2005/GA0/242205/N" . "Test Set Compaction and Compression for circuits with Scan"@en . . . "2"^^ . . "2004-01-01+01:00"^^ . . . "24220" .