. "20" . "590100" . "Nosek, Jaroslav" . . "Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns and Zero-Aliasing Compactor" . "6"^^ . . "P(GA102/04/2137)" . "RIV/46747885:24220/04:00000116" . . . "0923-8174" . . "14"^^ . "The paper presents new Built-in Self Test diagnostic method that spares hardware resources and keeps the memory requirements low."@en . "[0F523E7E6DD6]" . . . "%22built-in diagnostic aids;chip diagnostics%22"@en . "Pl\u00EDva, Zden\u011Bk" . . . "Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns and Zero-Aliasing Compactor"@en . . "Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns and Zero-Aliasing Compactor"@en . "DE - Spolkov\u00E1 republika N\u011Bmecko" . . "Kluwer Academic Publishers - Journal of Electronic Testing: Theory and Applications" . "Nov\u00E1 metoda vestaven\u00E9 diagnostiky, kter\u00E1 m\u00E1 ni\u017E\u0161\u00ED n\u00E1roky na pam\u011B\u0165 a hardware ne\u017E srovnateln\u00E9 dosud publikovan\u00E9 metody."@cs . "Nov\u00E1k, Ond\u0159ej" . "Gucwa, K." . "Vestav\u011Bn\u00E1 diagnostika \u010D\u00E1ste\u010Dn\u011B deterministick\u00FDmi testovac\u00EDmi vzorky a s analyz\u00E1torem odezev bezpe\u010Dn\u00FDm proti spl\u00FDv\u00E1n\u00ED odezev"@cs . "Hlawiczka, A." . "Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns and Zero-Aliasing Compactor" . "Neuveden" . "3"^^ . "The paper presents new Built-in Self Test diagnostic method that spares hardware resources and keeps the memory requirements low." . . . "Garbolino, T." . "24220" . "Vestav\u011Bn\u00E1 diagnostika \u010D\u00E1ste\u010Dn\u011B deterministick\u00FDmi testovac\u00EDmi vzorky a s analyz\u00E1torem odezev bezpe\u010Dn\u00FDm proti spl\u00FDv\u00E1n\u00ED odezev"@cs . . "109-122" . "RIV/46747885:24220/04:00000116!RIV/2005/GA0/242205/N" . .