"An Efficient Deterministic test Pattern Compaction Scheme Using Modified IC Scan Chain"@en . "2"^^ . . "An Efficient Deterministic test Pattern Compaction Scheme Using Modified IC Scan Chain" . . "Proc. of IEEE European Test Workshop (ETW\u00B400)" . "IC design"@en . . . "305" . . . "Nov\u00E1k, Ondrej" . "704331" . "An Efficient Deterministic test Pattern Compaction Scheme Using Modified IC Scan Chain" . "P(VS96006), Z(MSM 242200002)" . . . . . "An Efficient Deterministic test Pattern Compaction Scheme Using Modified IC Scan Chain"@en . "IEEE" . . "RIV/46747885:24220/00:00000029" . "24220" . "An Efficient Deterministic test Pattern Compaction Scheme Using Modified IC Scan Chain" . "Lisbon (Portugal)" . . . "[41C3336004EE]" . "An Efficient Deterministic test Pattern Compaction Scheme Using Modified IC Scan Chain"@en . "Nov\u00E1k, Ondrej" . "1"^^ . "RIV/46747885:24220/00:00000029!RIV/2001/MSM/242201/N" . . "2"^^ .