"Vacuum" . . "0042-207X" . "\u0160vec, Martin" . "415135" . "RIV/44555601:13440/07:00003785!RIV08-AV0-13440___" . . . . "[1BCFAD4BDBAC]" . . "138-141" . "Hrach, Rudolf" . "Composite films; Image analysis; Charge transport; Computer experiment"@en . "4"^^ . . "Nov\u00E1k, Stanislav" . . . "RIV/44555601:13440/07:00003785" . . . . "4"^^ . "GB - Spojen\u00E9 kr\u00E1lovstv\u00ED Velk\u00E9 Brit\u00E1nie a Severn\u00EDho Irska" . "Correlation between morpology and transport properties of composite films" . "Korelace mezi morfologick\u00FDmi a transportn\u00EDmi vlastnostmi kompozitn\u00EDch vrstev"@cs . "Morphological and electrical properties of composite films were studied and compared by a computer experiment. Voronoi tessellation was used for morphological characterization of the structures. The tunnel effect was the basic mechanism in electrical simulations performed." . "P(1ET400720409), P(LC06041)" . . . "V p\u0159\u00EDsp\u011Bvku jsou studov\u00E1ny a porovn\u00E1ny morfologick\u00E9 a elektrick\u00E9 vlastnosti kompozitn\u00EDch vrstev za pomoci po\u010D\u00EDta\u010Dov\u00E9ho experimentu. Morfologick\u00E9 charakteristiky byly analyzov\u00E1ny metodou Voronoiova dl\u00E1\u017Ed\u011Bn\u00ED. V p\u0159\u00EDpad\u011B simulac\u00ED elektrick\u00E9ho transportu byl za z\u00E1kladn\u00ED mechanismus pova\u017Eov\u00E1n tunelov\u00FD jev."@cs . "Morphological and electrical properties of composite films were studied and compared by a computer experiment. Voronoi tessellation was used for morphological characterization of the structures. The tunnel effect was the basic mechanism in electrical simulations performed."@en . "\u0160kvor, Ji\u0159\u00ED" . . . "Correlation between morpology and transport properties of composite films" . "82" . . . . "Correlation between morpology and transport properties of composite films"@en . "Korelace mezi morfologick\u00FDmi a transportn\u00EDmi vlastnostmi kompozitn\u00EDch vrstev"@cs . "4"^^ . "13440" . . "Correlation between morpology and transport properties of composite films"@en . .