. . "13430" . "Hrach, Rudolf" . "Study of electrical properties of thin metal films and composite films near the percolation threshold I"@en . . "Praha" . "Praha" . . "Study of electrical properties of thin metal films and composite films near the percolation threshold I"@en . . . "635-640" . "Composite films, Modelling, Morphological analysis, Electrical properties"@en . "2003-06-10+02:00"^^ . "0"^^ . "0"^^ . "2"^^ . . "2"^^ . . . "6"^^ . "[F6652DE12153]" . "Proceedings of Contribute Papers of WDS\u00B403" . "\u0160vec, Martin" . . . "629545" . "RIV/44555601:13430/03:00002357!RIV/2004/MSM/134304/N" . "The basic ideas of computer experiment for the study of connections between electrical and morphological characteristics of composite films of the structure metal-dielectric are given. The complete system of models will consist of three parts: the simulation of composite structure, its morphological analysis and the analysis of transport properties of simulated structure, followed by the analysis both of results of simulation and comparison with experimental data. As the total computer experiment is toolarge, in this contribution only its first part is presented, while the other parts are only briefly described and will be published next time. In the contribution five models both for the simulation of three-dimensional and two-dimensional structures w ere suggested and results of simulation compared both from the point of view of probable physical correctness and of computational effectiveness." . . "Study of electrical properties of thin metal films and composite films near the percolation threshold I" . . . "80-86732-18-5" . . "The basic ideas of computer experiment for the study of connections between electrical and morphological characteristics of composite films of the structure metal-dielectric are given. The complete system of models will consist of three parts: the simulation of composite structure, its morphological analysis and the analysis of transport properties of simulated structure, followed by the analysis both of results of simulation and comparison with experimental data. As the total computer experiment is toolarge, in this contribution only its first part is presented, while the other parts are only briefly described and will be published next time. In the contribution five models both for the simulation of three-dimensional and two-dimensional structures w ere suggested and results of simulation compared both from the point of view of probable physical correctness and of computational effectiveness."@en . . . "Univerzita Karlova v Praze. Matematicko-fyzik\u00E1ln\u00ED fakulta" . . . "RIV/44555601:13430/03:00002357" . "Z(MSM 113200002), Z(MSM 134300001)" . "Study of electrical properties of thin metal films and composite films near the percolation threshold I" .