. "http://www.isvav.cz/h12/resultDetail.do?rowId=RIV%2F00216305%3A26230%2F11%3APU96009!RIV12-MSM-26230___"^^ . . . "\u010Cl\u00E1nek ve sborn\u00EDku m\u00E1 uvedeno ISBN nebo ISSN, ale to nen\u00ED v datab\u00E1zi Conference Proceedings Citation Index spole\u010Dnosti Thomson Reuters." . . . "IEEE Design and Diagnostics of Electronic Circuits and Systems DDECS'2011" . "0"^^ . "0"^^ . . . . "qtv9nqajFxN1bsrw7g5IN.3hp+A=" . "0"^^ . . "Decreasing Test Time by Scan Chain Reorganization" . "RIV/00216305:26230/11:PU96009!RIV12-MSM-26230___" . "0"^^ . "0.8"^^ . . .