. "Sada n\u00E1stroj\u016F pro experimentov\u00E1n\u00ED s optimalizacemi v oblasti kompromisu mezi cenou a kvalitou n\u00E1vrhu pro snadnou testovatelnost \u010D\u00EDslicov\u00FDch obvod\u016F"@cs . . "The paper presents a toolset utilizable for learning and training principles related to design-for-testability of digital systems by means of structural and ad-hoc techniques. Actually, the toolset consists of two tools named SET and CADeT. Using the tools, user is allowed to make experiments in the optimization area which goal is to achieve feasible cost/quality trade-off among design-constraints and diagnostic requirements posed on a digital system. In the paper, basic education-related characteristics of the tools are briefly presented." . "Vysok\u00E9 u\u010Den\u00ED technick\u00E9 v Brn\u011B" . "333-338" . . . . . "Proceedings of 14th Electronic Devices and Systems IMAPS CS International Conference" . "Brno" . "Ve \u010Dl\u00E1nku jsou p\u0159edstaveny n\u00E1stroje vyu\u017Eiteln\u00E9 pro v\u00FDuku a procvi\u010Dov\u00E1n\u00ED orincip\u016F souvisej\u00EDc\u00EDch s n\u00E1vrhem pro snadnou testovatelnost \u010D\u00EDslicov\u00FDch syst\u00E9m\u016F pomoc\u00ED struktur\u00E1ln\u00EDch a ad-hoc technik. Jsou prezentov\u00E1ny n\u00E1stroje SET a CADeT, s jejich\u017E vyu\u017Eit\u00EDm je u\u017Eivatel schopen spou\u0161t\u011Bt experimenty v oblasti optimalizace s c\u00EDlem dosa\u017Een\u00ED p\u0159ijateln\u00E9ho kompromisu mezi cenou a kvalitou mezi u\u017Eivatelsk\u00FDmi n\u00E1vrhov\u00FDmi omezen\u00EDmi a di\u00E4gnostick\u00FDmi vlastnostmi v\u00FDsledn\u00E9ho syst\u00E9mu. \u010Cl\u00E1nek je zam\u011B\u0159en zejm\u00E9na na nast\u00EDn\u011Bn\u00ED v\u00FDzkumn\u011B-v\u00FDukov\u00FDch mo\u017Enost\u00ED n\u00E1stroj\u016F SET a CADeT."@cs . "Brno" . "Educational Toolset for Experimenting with Optimizations in the Area of Cost/Quality Trade-Offs Related to Digital Circuit Diagnosis"@en . . . . "Educational Toolset for Experimenting with Optimizations in the Area of Cost/Quality Trade-Offs Related to Digital Circuit Diagnosis"@en . . . "Strnadel, Josef" . . "418736" . . "Educational Toolset for Experimenting with Optimizations in the Area of Cost/Quality Trade-Offs Related to Digital Circuit Diagnosis" . "scan, design for testability, education, tool, consequence, diagnosis, design, trade-off, constraints, testability, scan chain"@en . . . "Sada n\u00E1stroj\u016F pro experimentov\u00E1n\u00ED s optimalizacemi v oblasti kompromisu mezi cenou a kvalitou n\u00E1vrhu pro snadnou testovatelnost \u010D\u00EDslicov\u00FDch obvod\u016F"@cs . . "P(GP102/05/P193), Z(MSM0021630528)" . "Educational Toolset for Experimenting with Optimizations in the Area of Cost/Quality Trade-Offs Related to Digital Circuit Diagnosis" . "978-80-214-3470-7" . . . . . . "RIV/00216305:26230/07:PU70842" . "[0C347130D126]" . . . "1"^^ . . "6"^^ . "1"^^ . "2007-09-20+02:00"^^ . "26230" . "The paper presents a toolset utilizable for learning and training principles related to design-for-testability of digital systems by means of structural and ad-hoc techniques. Actually, the toolset consists of two tools named SET and CADeT. Using the tools, user is allowed to make experiments in the optimization area which goal is to achieve feasible cost/quality trade-off among design-constraints and diagnostic requirements posed on a digital system. In the paper, basic education-related characteristics of the tools are briefly presented."@en . "RIV/00216305:26230/07:PU70842!RIV08-MSM-26230___" . . .