"Los Alamitos, CA" . . "SET: Interaktivn\u00ED n\u00E1stroj pro v\u00FDuku a procvi\u010Dov\u00E1n\u00ED princip\u016F scan DFT technik a jejich vlivu na parametry vestav\u011Bn\u00FDch syst\u00E9m\u016F"@cs . "P(GA102/04/0737), P(GP102/05/P193)" . . . "SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System" . . . . "26230" . "RIV/00216305:26230/06:PU66866!RIV07-GA0-26230___" . . . "Potsdam" . "2"^^ . "0-7695-2546-6" . . "2006-03-26+01:00"^^ . "Ve \u010Dl\u00E1nku jsou p\u0159edstaveny z\u00E1kladn\u00ED vlastnosti n\u00E1stroje pro v\u00FDuku a prosvi\u010Dov\u00E1n\u00ED princip\u016F souvisej\u00EDc\u00EDch se scan technikou n\u00E1vrhu pro snadnou testovatelnost. Je nast\u00EDn\u011Bno, jak lze dan\u00FD n\u00E1stroj vyu\u017E\u00EDt ve v\u00FDukov\u00E9m procesu, a to zejm\u00E9na p\u0159i ilustraci vztah\u016F mezi n\u00E1vrhov\u00FDmi a diagnostick\u00FDmi vlastnostmi \u010D\u00EDslicov\u00E9ho syst\u00E9mu."@cs . . "SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System"@en . "[BF451BC4FB89]" . . "Kot\u00E1sek, Zden\u011Bk" . . . . "Strnadel, Josef" . "497-498" . . . "Proceedings of the 13th IEEE International Symposium and Workshop on the Engineering of Computer-Based Systems (ECBS)" . . "2"^^ . "499038" . . "In the paper, upgraded version of our tool for learning and training of scan design for testability technique principles and its consequences to parameters of embedded system is presented. It is outlined how the tool can be utilized in education process in order to ilustrate relation between design and diagnostic parameters of embeded system." . "2"^^ . "SET: Interaktivn\u00ED n\u00E1stroj pro v\u00FDuku a procvi\u010Dov\u00E1n\u00ED princip\u016F scan DFT technik a jejich vlivu na parametry vestav\u011Bn\u00FDch syst\u00E9m\u016F"@cs . "RIV/00216305:26230/06:PU66866" . "SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System" . . . "In the paper, upgraded version of our tool for learning and training of scan design for testability technique principles and its consequences to parameters of embedded system is presented. It is outlined how the tool can be utilized in education process in order to ilustrate relation between design and diagnostic parameters of embeded system."@en . . "scan, design for testability, education, tool, consequence, diagnosis, design, trade-off, constraints, testability, scan chain"@en . "SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System"@en . "IEEE Computer Society" . . . . . .