"26230" . . "Normalized Testability Measures at RT Level: Utilization and Reasons for Creation" . "80-85988-71-2" . "Ostrava" . "Strnadel, Josef" . . . "Proceedings of 36th International Conference MOSIS`02 Modeling and Simulation of Systems" . "0"^^ . "2"^^ . "0"^^ . "Normalized Testability Measures at RT Level: Utilization and Reasons for Creation"@en . "RIV/00216305:26230/02:PU36201" . . . "8"^^ . . . "Neuveden" . . "Ro\u017Enov pod Radho\u0161t\u011Bm" . "[DA54988D3707]" . "Z(MSM 262200012)" . . "The paper deals with a design overview of special-property factors for testability valuation of a digital circuit at RT level. The reasons for development of such factors and a way of their utilization are presented in this paper. Then, mathematical formulas are used to demonstrate these factors in a formal way and finally experimental results are presented."@en . . . . "Normalized Testability Measures at RT Level: Utilization and Reasons for Creation" . "Kot\u00E1sek, Zden\u011Bk" . . "The paper deals with a design overview of special-property factors for testability valuation of a digital circuit at RT level. The reasons for development of such factors and a way of their utilization are presented in this paper. Then, mathematical formulas are used to demonstrate these factors in a formal way and finally experimental results are presented." . . . "Register-transfer level, controllability, observability, testability, testability analysis"@en . . "655831" . . . "2002-04-22+02:00"^^ . "Normalized Testability Measures at RT Level: Utilization and Reasons for Creation"@en . "297-304" . . "RIV/00216305:26230/02:PU36201!RIV/2003/MSM/262303/N" . "2"^^ .