"Dallaeva, Dinara" . "4"^^ . "RIV/00216305:26220/13:PU102934" . . "Tom\u00E1nek, Pavel" . . . . . "85338" . "P(ED1.1.00/02.0068), P(GAP102/11/0995)" . "3" . "3"^^ . . "Jemn\u00E1 mechanika a optika" . "4"^^ . "Lok\u00E1ln\u00ED optoelektronick\u00E1 diagnostika mikroskopick\u00FDch vad v sol\u00E1rn\u00EDm k\u0159em\u00EDkov\u00E9m \u010Dl\u00E1nku" . "Lok\u00E1ln\u00ED optoelektronick\u00E1 diagnostika mikroskopick\u00FDch vad v sol\u00E1rn\u00EDm k\u0159em\u00EDkov\u00E9m \u010Dl\u00E1nku"@cs . . . "\u0160karvada, Pavel" . "Lok\u00E1ln\u00ED optoelektronick\u00E1 diagnostika mikroskopick\u00FDch vad v sol\u00E1rn\u00EDm k\u0159em\u00EDkov\u00E9m \u010Dl\u00E1nku"@en . "RIV/00216305:26220/13:PU102934!RIV14-GA0-26220___" . . "2013" . "Lok\u00E1ln\u00ED optoelektronick\u00E1 diagnostika mikroskopick\u00FDch vad v sol\u00E1rn\u00EDm k\u0159em\u00EDkov\u00E9m \u010Dl\u00E1nku" . . "k\u0159em\u00EDk, sol\u00E1rn\u00ED \u010Dl\u00E1nek, defekt, lok\u00E1ln\u00ED mikroskopie"@en . . . "[61ABBDA5923D]" . "Lok\u00E1ln\u00ED optoelektronick\u00E1 diagnostika mikroskopick\u00FDch vad v sol\u00E1rn\u00EDm k\u0159em\u00EDkov\u00E9m \u010Dl\u00E1nku"@cs . "CZ - \u010Cesk\u00E1 republika" . "V\u00FDzkum a v\u00FDvoj fotovotaick\u00FDch sol\u00E1rn\u00EDch \u010Dl\u00E1nk\u016F hraje st\u00E1le v\u011Bt\u0161\u00ED praktickou roli v dod\u00E1vk\u00E1ch energie i p\u0159i ochran\u011B \u017Eivotn\u00EDho prost\u0159ed\u00ED na cel\u00E9m sv\u011Bt\u011B. Modern\u00ED skenovac\u00ED mikroskopick\u00E9 techniky se daj\u00ED s \u00FAsp\u011Bchem aplikovat i na oblast lok\u00E1ln\u00ED diagnostiky vad a defekt\u016F monokrystalick\u00FDch k\u0159em\u00EDkov\u00FDch sol\u00E1rn\u00EDch \u010Dl\u00E1nk\u016F. Navr\u017Een\u00E1 metoda kombinuje t\u0159i r\u016Fzn\u00E1 m\u011B\u0159en\u00ED: elektrick\u00E9ho \u0161umu, m\u00EDstn\u00ED topografie a lok\u00E1ln\u011B indukovan\u00E9ho fotoproudu. K ov\u011B\u0159en\u00ED praveditelnosti t\u00E9to metody jsme vybrali jeden skryt\u00FD defekt v objemu a jeden defekt na povrchu vzorku monokrystalick\u00E9ho k\u0159em\u00EDkov\u00E9ho \u010Dl\u00E1nku, kter\u00FD vyza\u0159uje sv\u011Btlo v z\u00E1v\u011Brn\u00E9m re\u017Eimu."@cs . . . "26220" . "Lok\u00E1ln\u00ED optoelektronick\u00E1 diagnostika mikroskopick\u00FDch vad v sol\u00E1rn\u00EDm k\u0159em\u00EDkov\u00E9m \u010Dl\u00E1nku"@en . . . "Grmela, Lubom\u00EDr" . "V\u00FDzkum a v\u00FDvoj fotovotaick\u00FDch sol\u00E1rn\u00EDch \u010Dl\u00E1nk\u016F hraje st\u00E1le v\u011Bt\u0161\u00ED praktickou roli v dod\u00E1vk\u00E1ch energie i p\u0159i ochran\u011B \u017Eivotn\u00EDho prost\u0159ed\u00ED na cel\u00E9m sv\u011Bt\u011B. Modern\u00ED skenovac\u00ED mikroskopick\u00E9 techniky se daj\u00ED s \u00FAsp\u011Bchem aplikovat i na oblast lok\u00E1ln\u00ED diagnostiky vad a defekt\u016F monokrystalick\u00FDch k\u0159em\u00EDkov\u00FDch sol\u00E1rn\u00EDch \u010Dl\u00E1nk\u016F. Navr\u017Een\u00E1 metoda kombinuje t\u0159i r\u016Fzn\u00E1 m\u011B\u0159en\u00ED: elektrick\u00E9ho \u0161umu, m\u00EDstn\u00ED topografie a lok\u00E1ln\u011B indukovan\u00E9ho fotoproudu. K ov\u011B\u0159en\u00ED praveditelnosti t\u00E9to metody jsme vybrali jeden skryt\u00FD defekt v objemu a jeden defekt na povrchu vzorku monokrystalick\u00E9ho k\u0159em\u00EDkov\u00E9ho \u010Dl\u00E1nku, kter\u00FD vyza\u0159uje sv\u011Btlo v z\u00E1v\u011Brn\u00E9m re\u017Eimu."@en . . "Dallaeva, Dinara" . "V\u00FDzkum a v\u00FDvoj fotovotaick\u00FDch sol\u00E1rn\u00EDch \u010Dl\u00E1nk\u016F hraje st\u00E1le v\u011Bt\u0161\u00ED praktickou roli v dod\u00E1vk\u00E1ch energie i p\u0159i ochran\u011B \u017Eivotn\u00EDho prost\u0159ed\u00ED na cel\u00E9m sv\u011Bt\u011B. Modern\u00ED skenovac\u00ED mikroskopick\u00E9 techniky se daj\u00ED s \u00FAsp\u011Bchem aplikovat i na oblast lok\u00E1ln\u00ED diagnostiky vad a defekt\u016F monokrystalick\u00FDch k\u0159em\u00EDkov\u00FDch sol\u00E1rn\u00EDch \u010Dl\u00E1nk\u016F. Navr\u017Een\u00E1 metoda kombinuje t\u0159i r\u016Fzn\u00E1 m\u011B\u0159en\u00ED: elektrick\u00E9ho \u0161umu, m\u00EDstn\u00ED topografie a lok\u00E1ln\u011B indukovan\u00E9ho fotoproudu. K ov\u011B\u0159en\u00ED praveditelnosti t\u00E9to metody jsme vybrali jeden skryt\u00FD defekt v objemu a jeden defekt na povrchu vzorku monokrystalick\u00E9ho k\u0159em\u00EDkov\u00E9ho \u010Dl\u00E1nku, kter\u00FD vyza\u0159uje sv\u011Btlo v z\u00E1v\u011Brn\u00E9m re\u017Eimu." . . "0447-6441" . .