. . "3"^^ . . . "26220" . "RIV/00216305:26220/12:PU99175" . "MICRO-SIZED LOCAL DEFECTS ON THE EDGES OF SILICON SOLAR CELLS" . "MICRO-SIZED LOCAL DEFECTS ON THE EDGES OF SILICON SOLAR CELLS" . . . . . "2012-06-28+02:00"^^ . "The article deals with the diagnostics application to local defects on the edge in silicon solar cells by monitoring their optical and thermal activities during electrical excitation. During the measurement is solar cell connected to a voltage source in the reverse direction. Radiation generated from reverse-biased pn junction defects is used to study local properties. It proves to be useful to measure surface radiation and to make light spots (defects) localization. By the same way is possible to measure the radiation intensity and optical spectrum." . "MICRO-SIZED LOCAL DEFECTS ON THE EDGES OF SILICON SOLAR CELLS"@en . . "Brno" . . "MICRO-SIZED LOCAL DEFECTS ON THE EDGES OF SILICON SOLAR CELLS"@en . "Brno" . . "Mack\u016F, Robert" . . "Koktav\u00FD, Pavel" . "The article deals with the diagnostics application to local defects on the edge in silicon solar cells by monitoring their optical and thermal activities during electrical excitation. During the measurement is solar cell connected to a voltage source in the reverse direction. Radiation generated from reverse-biased pn junction defects is used to study local properties. It proves to be useful to measure surface radiation and to make light spots (defects) localization. By the same way is possible to measure the radiation intensity and optical spectrum."@en . "P(GAP102/10/2013), P(GD102/09/H074)" . . "150398" . . . "\u0160icner, Ji\u0159\u00ED" . "6"^^ . "978-80-214-4539-0" . . . "Solar cell, local defect, nondestructive testing."@en . "1"^^ . "LITERA" . "Electronic Devices and Systems IMAPS CS International Conference 2012" . "[830EC97BC6DC]" . "RIV/00216305:26220/12:PU99175!RIV13-GA0-26220___" . .